Kelene A. Fercho

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Ifat Levy

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Publications

2022
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Delin Sun, Gopalkumar Rakesh, Courtney C. Haswell, Mark W. Logue, C. Lexi Baird, Erin O'Leary, Andrew S. Cotton, Hong Xie, Marijo B. Tamburrino, Tian Chen, Emily L. Dennis, Neda Jahanshad, Lauren E. Salminen, Sophia I. Thomopoulos, Faisal Rashid, Christopher R. K. Ching, Saskia B. J. Koch, Jessie L. Frijling, Laura Nawijn, Mirjam van Zuiden, Xi Zhu, Benjamin Suarez-Jimenez, Anika Sierk, Henrik Walter, Antje Manthey, Jennifer S. Stevens, Negar Fani, Sanne J. H. van Rooij, Murray B. Stein, Jessica Bomyea, Inga Koerte, Kyle Choi, Steven J. A. van der Werff, Robert R. J. M. Vermeiren, Julia Herzog, Lauren A. M. Lebois, Justin T. Baker, Elizabeth A. Olson, Thomas Straube, Mayuresh S. Korgaonkar, Elpiniki Andrew, Ye Zhu, Gen Li, Jonathan Ipser, Anna R. Hudson, Matthew Peverill, Kelly A. Sambrook, Evan Gordon, Lee Baugh, Gina L. Forster, Raluca M. Simons, Jeffrey S. Simons, Vincent Magnotta, Adi Maron-Katz, Stefan du Plessis, Seth G. Disner, Nicholas D. Davenport, Daniel W. Grupe, Jack B. Nitschke, Terri A. deRoon-Cassini, Jacklynn M. Fitzgerald, John H. Krystal, Ifat Levy, Miranda Olff, Dick J. Veltman, Li Wang, Yuval Neria, Michael D. De Bellis, Tanja Jovanovic, Judith K. Daniels, Martha Shenton, Nic J. A. van der Wee, Christian Schmahl, Milissa L. Kaufman, Isabelle M. Rosso, Scott R. Sponheim, David Bernd Hofmann, Richard A. Bryant, Kelene A. Fercho, Dan J. Stein, Sven C. Mueller, Bobak Hosseini, K. Luan Phan, Katie A. McLaughlin, Richard J. Davidson, Christine L. Larson, Geoffrey May, Steven M. Nelson, Chadi G. Abdallah, Hassaan Gomaa, Amit Etkin, Zelekha A. Seedat, Ilan Harpaz-Rotem, Israel Liberzon, Theo G. M. van Erp, Yann Quidé, Xin Wang, Paul M. Thompson, Rajendra A. Morey:
A comparison of methods to harmonize cortical thickness measurements across scanners and sites. NeuroImage 261: 119509 (2022)

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