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James D. Menldl

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2000 – 2009

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2000
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Keith A. Bowman, Xinghai Tang, John C. Eble, James D. Menldl:
Impact of extrinsic and intrinsic parameter fluctuations on CMOS circuit performance. IEEE J. Solid State Circuits 35(8): 1186-1193 (2000)

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