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Patrick Mezenge

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2012
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Benoit Lambert, Jim Thorpe, Reza Behtash, Bernd Schauwecker, Franck Bourgeois, Helmut Jung, Joëlle Bataille, Patrick Mezenge, Cyril Gourdon, Catherine Ollivier, Didier Floriot, Hervé Blanck:
Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification. Microelectron. Reliab. 52(9-10): 2200-2204 (2012)

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