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Volker H.-W. Meyer

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2003
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Volker H.-W. Meyer:
Test produktionsbedingter Laufzeitfehler in hochintegrierten, digitalen Schaltungen (Production test of delay faults in digital VLSI circuits). Bremen University, Germany, 2003

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2018
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Marco Franke, Volker H.-W. Meyer, Rainer Rasche, Andreas Himmler, Klaus-Dieter Thoben:
Interoperability of Test Procedures Between Enterprises: Intermediate Representation for Test Procedure Exchange. I-ESA 2018: 177-188

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