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Karel J. E. van Eerdewijk

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1986
[j1]
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Frans P. M. Beenker, Karel J. E. van Eerdewijk, Robert B. W. Gerritsen, Frank N. Peacock, Max van der Star:
Macro Testing: Unifying IC and Board Test. IEEE Des. Test 3(6): 26-32 (1986)

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