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Kai-Chun Zhan

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2020 – today

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2020
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Yu-Chen Lin, Kai-Chun Zhan, Ji-Min Zhang, Jian-Ming Chen, Cheng-Hsun-Tony Chang, Shea-Jue Wang, Mu-Chun Wang:
Junction Integrity for 28nm High-k nMOSFETs with Thermal Stress. ICKII 2020: 64-66

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