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Alain Meresse

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2000 – 2009

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2009
[j2]
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  - journals/mr/GrosDML09
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  - https://dblp.org/rec/journals/mr/GrosDML09
Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant:
Electromagnetic immunity model of an ADC for microcontroller's reliability improvement. Microelectron. Reliab. 49(9-11): 963-966 (2009)
2007
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Geneviève Duchamp, D. Castagnet, Alain Meresse:
Near-field EMC study to improve electronic component reliability. Microelectron. Reliab. 47(9-11): 1668-1672 (2007)

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