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Stefan Schmult

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2010 – 2019

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2019
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Raoul Hentschel, Andre Wachowiak, A. Großer, Simon Kotzea, A. Debald, Holger Kalisch, Andrei Vescan, A. Jahn, Stefan Schmult, Thomas Mikolajick:
Extraction of the active acceptor concentration in (pseudo-) vertical GaN MOSFETs using the body-bias effect. Microelectron. J. 91: 42-45 (2019)

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