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J. H. M. Tng

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2019
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Benyuan Zhu, E. M. Bazizi, J. H. M. Tng, Z. Li, E. K. Banghart, M. K. Hassan, Y. Hu, D. Zhou, D. Choi, L. Qin, Xuan Wan:
TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement. IRPS 2019: 1-4

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