Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

N. Mohankumar 0002

> Home > Persons

Person information

affiliation: SKP Engineering College, Thiruvannamalai, India
affiliation (former): Jadavpur University, Kolkata, India

Other persons with the same name

see FAQ

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

Journal Articles

see FAQ

What is the meaning of the colors in the publication lists?

2015
[j8]
- view
  authority control:
- export record
  dblp key:
  - journals/mj/JebalinRPMN15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/JebalinRPMN15
Binola K. Jebalin, A. Shobha Rekh, P. Prajoon, N. Mohankumar, D. Nirmal:
The influence of high-k passivation layer on breakdown voltage of Schottky AlGaN/GaN HEMTs. Microelectron. J. 46(12): 1387-1391 (2015)
2014
[j7]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/PatiKDMS14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PatiKDMS14
Sudhansu Kumar Pati, Kalyan Koley, Arka Dutta, N. Mohankumar, Chandan Kumar Sarkar:
Study of body and oxide thickness variation on analog and RF performance of underlap DG-MOSFETs. Microelectron. Reliab. 54(6-7): 1137-1142 (2014)
[j6]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/AnandanNM14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/AnandanNM14
P. Anandan, A. Nithya, N. Mohankumar:
Simulation of flicker noise in gate-all-around Silicon Nanowire MOSFETs including interface traps. Microelectron. Reliab. 54(12): 2723-2727 (2014)
2013
[j5]
- view
  authority control:
- export record
  dblp key:
  - journals/ijcta/NirmalVSM13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijcta/NirmalVSM13
D. Nirmal, P. Vijayakumar, K. Shruti, N. Mohankumar:
Nanoscale channel engineered double gate MOSFET for mixed signal applications using high-k dielectric. Int. J. Circuit Theory Appl. 41(6): 608-618 (2013)
[j4]
- view
  - electronic edition via DOI (open access)
  - references & citations
  authority control:
- export record
  dblp key:
  - journals/ijdsn/SaravanakumarMR13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijdsn/SaravanakumarMR13
Radhakrishnan Saravanakumar, N. Mohankumar, J. Raja:
Proficient Node Scheduling Protocol for Homogeneous and Heterogeneous Wireless Sensor Networks. Int. J. Distributed Sens. Networks 9 (2013)
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/NirmalVTJM13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/NirmalVTJM13
D. Nirmal, P. Vijayakumar, Divya Mary Thomas, Binola K. Jebalin, N. Mohankumar:
Subthreshold performance of gate engineered FinFET devices and circuit with high-k dielectrics. Microelectron. Reliab. 53(3): 499-504 (2013)
2012
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/KoleySKMS12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/KoleySKMS12
Kalyan Koley, Binit Syamal, Atanu Kundu, N. Mohankumar, Chandan Kumar Sarkar:
Subthreshold analog/RF performance of underlap DG FETs with asymmetric source/drain extensions. Microelectron. Reliab. 52(11): 2572-2578 (2012)
2009
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/MohankumarSS09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MohankumarSS09
N. Mohankumar, Binit Syamal, Chandan Kumar Sarkar:
Investigation of novel attributes of single halo dual-material double gate MOSFETs for analog/RF applications. Microelectron. Reliab. 49(12): 1491-1497 (2009)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.