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ORCIDJoaquín Campos 0001
Person information
- affiliation: Institute of Optics "Daza de Valdés", IO-CSIC, Madrid, Spain
Other persons with the same name
- Joaquín Campos 0002 — University of Irapuato, Mexico
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2010 – 2019
- 2019
[c7]Eric Kirchner, Ivo van der Lans, Pim Koeckhoven, Khalil Huraibat, Francisco Martínez-Verdú, Esther Perales, Alejandro Ferrero, Joaquín Campos
:
Real-time accurate rendering of color and texture of car coatings. Color Imaging: Displaying, Processing, Hardcopy, and Applications 2019: 1-6- 2018
- [j1]Fernando Ortega-Ojeda, Matías Calcerrada, Alejandro Ferrero, Joaquín Campos, Carmen Garcia-Ruiz:
Measuring the Human Ultra-Weak Photon Emission Distribution Using an Electron-Multiplying, Charge-Coupled Device as a Sensor. Sensors 18(4): 1152 (2018) - 2017
- [c6]Khalil Huraibat, Esther Perales, Eric Kirchner, Ivo van der Lans, Alejandro Ferrero, Joaquín Campos, Francisco Martínez-Verdú:
Spectral and Color Characterization of a Quantum Dots Display for Gonio-Apparent Colors. CIC 2017: 177-181 - 2015
- [c5]Berta Bernad, Alejandro Ferrero, Alicia Pons, M. Luisa Hernanz, Joaquín Campos Acosta:
Upgrade of goniospectrophtometer GEFE for near-field scattering and fluorescence radiance measurements. Measuring, Modeling, and Reproducing Material Appearance 2015: 93980E - [c4]Eric Kirchner, Ivo van der Lans, Alejandro Ferrero, Joaquín Campos, Francisco Martínez-Verdú, Esther Perales:
Fast And Accurate 3D Rendering Of Automotive Coatings. CIC 2015: 154-160 - [c3]Omar Gómez, Esther Perales, Elísabet Chorro, Valentín Viqueira, Francisco Martínez-Verdú, Alejandro Ferrero, Joaquín Campos:
Influence of the Effect Pigment Size on the Sparkle Detection Distance. CIC 2015: 175-179 - 2014
- [c2]Alejandro Ferrero, Berta Bernad, Joaquín Campos, Francisco Martínez-Verdú, Esther Perales, Ivo van der Lans, Eric Kirchner:
Towards a better understanding of the color shift of effect coatings by densely sampled spectral BRDF measurement. Measuring, Modeling, and Reproducing Material Appearance 2014: 90180K - [c1]Andreas Höpe, Annette Koo, Francisco Martínez-Verdú, Frédéric B. Leloup, Gaël Obein, Gerd Wübbeler, Joaquín Campos, Paola Iacomussi, Priit Jaanson, Stefan Källberg, Marek Smíd:
"Multidimensional reflectometry for industry" (xD-Reflect) an European research project. Measuring, Modeling, and Reproducing Material Appearance 2014: 901804
Coauthor Index
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