BibTeX records: Sebastian Simon

download as .bib file

@inproceedings{DBLP:conf/date/SinghDSSGFSKBEM19,
  author    = {Eshan Singh and
               Keerthikumara Devarajegowda and
               Sebastian Simon and
               Ralf Schnieder and
               Karthik Ganesan and
               Mohammad Rahmani Fadiheh and
               Dominik Stoffel and
               Wolfgang Kunz and
               Clark W. Barrett and
               Wolfgang Ecker and
               Subhasish Mitra},
  editor    = {J{\"{u}}rgen Teich and
               Franco Fummi},
  title     = {Symbolic {QED} Pre-silicon Verification for Automotive Microcontroller
               Cores: Industrial Case Study},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2019, Florence, Italy, March 25-29, 2019},
  pages     = {1000--1005},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.23919/DATE.2019.8715271},
  doi       = {10.23919/DATE.2019.8715271},
  timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/date/SinghDSSGFSKBEM19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-1902-01494,
  author    = {Eshan Singh and
               Keerthikumara Devarajegowda and
               Sebastian Simon and
               Ralf Schnieder and
               Karthik Ganesan and
               Mohammad Rahmani Fadiheh and
               Dominik Stoffel and
               Wolfgang Kunz and
               Clark W. Barrett and
               Wolfgang Ecker and
               Subhasish Mitra},
  title     = {Symbolic {QED} Pre-silicon Verification for Automotive Microcontroller
               Cores: Industrial Case Study},
  journal   = {CoRR},
  volume    = {abs/1902.01494},
  year      = {2019},
  url       = {http://arxiv.org/abs/1902.01494},
  archivePrefix = {arXiv},
  eprint    = {1902.01494},
  timestamp = {Fri, 15 Nov 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/corr/abs-1902-01494.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SimonBRKM17,
  author    = {Sebastian Simon and
               Deeksha Bhat and
               Alexander W. Rath and
               J{\'{e}}r{\^{o}}me Kirscher and
               Linus Maurer},
  title     = {Coverage-driven mixed-signal verification of smart power ICs in a
               {UVM} environment},
  booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
               May 22-26, 2017},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/ETS.2017.7968237},
  doi       = {10.1109/ETS.2017.7968237},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/SimonBRKM17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mbmv/SimonKRZM17,
  author    = {Sebastian Simon and
               J{\'{e}}r{\^{o}}me Kirscher and
               Alexander W. Rath and
               Zhiqiang Zhang and
               Linus Maurer},
  editor    = {Daniel Gro{\ss}e and
               Rolf Drechsler},
  title     = {Pre-silicon Verification of an Automotive Battery Management System
               in the Context of the Application},
  booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
               von Schaltungen und Systemen, {MBMV} 2017, Bremen, Germany, February
               8-9, 2017},
  pages     = {91--102},
  publisher = {Shaker Verlag},
  year      = {2017},
  timestamp = {Mon, 20 Nov 2017 10:25:21 +0100},
  biburl    = {https://dblp.org/rec/conf/mbmv/SimonKRZM17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/smacd/SimonKKRPM16,
  author    = {Sebastian Simon and
               Ozlem Karaca and
               J{\'{e}}r{\^{o}}me Kirscher and
               Alexander W. Rath and
               Georg Pelz and
               Linus Maurer},
  title     = {Safety-oriented mixed-signal verification of automotive power devices
               in a {UVM} environment},
  booktitle = {13th International Conference on Synthesis, Modeling, Analysis and
               Simulation Methods and Applications to Circuit Design, {SMACD} 2016,
               Lisbon, Portugal, June 27-30, 2016},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/SMACD.2016.7520718},
  doi       = {10.1109/SMACD.2016.7520718},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/smacd/SimonKKRPM16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/RathSEE16,
  author    = {Alexander W. Rath and
               Sebastian Simon and
               Volkan Esen and
               Wolfgang Ecker},
  title     = {Automatically comparing analog behavior using Earth Mover's Distance},
  booktitle = {2016 {IFIP/IEEE} International Conference on Very Large Scale Integration,
               VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016},
  pages     = {1--8},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/VLSI-SoC.2016.7753556},
  doi       = {10.1109/VLSI-SoC.2016.7753556},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/conf/vlsi/RathSEE16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/RathSEE16a,
  author    = {Alexander W. Rath and
               Sebastian Simon and
               Volkan Esen and
               Wolfgang Ecker},
  editor    = {Thomas Hollstein and
               Jaan Raik and
               Sergei Kostin and
               Anton Tsertov and
               Ian O'Connor and
               Ricardo Reis},
  title     = {Earth Mover's Distance as a Comparison Metric for Analog Behavior},
  booktitle = {VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification
               and Reliability - 24th {IFIP} {WG} 10.5/IEEE International Conference
               on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia,
               September 26-28, 2016, Revised Selected Papers},
  series    = {{IFIP} Advances in Information and Communication Technology},
  volume    = {508},
  pages     = {173--191},
  publisher = {Springer},
  year      = {2016},
  url       = {https://doi.org/10.1007/978-3-319-67104-8\_9},
  doi       = {10.1007/978-3-319-67104-8\_9},
  timestamp = {Tue, 22 Oct 2019 15:21:19 +0200},
  biburl    = {https://dblp.org/rec/conf/vlsi/RathSEE16a.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of Schloss Dagstuhl - Leibniz Center for Informatics