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Alain Toureille

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2000 – 2009

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2008
[c2]
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Ludovic Boyer, Olivier Fruchier, Petru Notingher Jr., Serge Agnel, Alain Toureille, Bernard Rousset, Jean-Louis Sanchez:
Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach. IAS 2008: 1-6
2007
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Olivier Fruchier, Petru Notingher Jr., Serge Agnel, Alain Toureille, F. Forest, S. Cunningham, Bernard Rousset, Jean-Louis Sanchez:
Applications of the Thermal Step Method to the Characterization of Electric Charge in MOS Components. IAS 2007: 444-451

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