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K. Schepers

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2004
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Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger:
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. Microelectron. Reliab. 44(9-11): 1849-1854 (2004)

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