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C.-K. Hu

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2004
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J. R. Lloyd, M. R. Lane, X.-H. Liu, E. Liniger, T. M. Shaw, C.-K. Hu, R. Rosenberg:
Reliability Challenges with Ultra-Low k Interlevel Dielectrics. Microelectron. Reliab. 44(9-11): 1835-1841 (2004)

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