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Martin Fritz Mueller

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affiliation: Texas Instruments Inc., Dallas, TX, USA
affiliation (PhD 2014): Georgia Institute of Technology, Atlanta, GA, USA

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2015
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Martin Fritz Mueller:
Physics-driven variational methods for computer vision and shape-based imaging. Georgia Institute of Technology, Atlanta, GA, USA, 2015

Journal Articles

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2015
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Daniel A. Cook, Martin Fritz Mueller, Francesco Fedele, Anthony J. Yezzi:
Adjoint Active Surfaces for Localization and Imaging. IEEE Trans. Image Process. 24(1): 316-331 (2015)

Conference and Workshop Papers

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2018
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Fareed ud din Mehmood Jafri, Martin Fritz Mueller, Anthony Joseph Yezzi:
A Mumford Shah Style Unified Framework for Layering: Pitfalls and Solutions. ISVC 2018: 344-356

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