
BibTeX records: Matty Caymax
@inproceedings{DBLP:conf/essderc/SchramSGHKTDDLL17, author = {Tom Schram and Quentin Smets and Benjamin Groven and M. H. Heyne and E. Kunnen and A. Thiam and K. Devriendt and Annelies Delabie and Dennis Lin and M. Lux and Daniele Chiappe and I. Asselberghs and S. Brus and Cedric Huyghebaert and S. Sayan and A. Juncker and Matty Caymax and Iuliana P. Radu}, title = {{WS2} transistors on 300 mm wafers with {BEOL} compatibility}, booktitle = {47th European Solid-State Device Research Conference, {ESSDERC} 2017, Leuven, Belgium, September 11-14, 2017}, pages = {212--215}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ESSDERC.2017.8066629}, doi = {10.1109/ESSDERC.2017.8066629}, timestamp = {Thu, 05 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/essderc/SchramSGHKTDDLL17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KaushikCDERCRWCG05, author = {Vidya Kaushik and Martine Claes and Annelies Delabie and Sven Van Elshocht and Olivier Richard and Thierry Conard and Erika Rohr and Thomas Witters and Matty Caymax and Stefan De Gendt}, title = {Observation and characterization of defects in HfO\({}_{\mbox{2}}\) high-K gate dielectric layers}, journal = {Microelectron. Reliab.}, volume = {45}, number = {5-6}, pages = {798--801}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2004.11.045}, doi = {10.1016/j.microrel.2004.11.045}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KaushikCDERCRWCG05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.