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S. Dhombres

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2013
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Alain Michez, Jerome Boch, S. Dhombres, Frédéric Saigné, Antoine D. Touboul, J.-R. Vaillé, Laurent Dusseau, E. Lorfèvre, R. Ecoffet:
Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET. Microelectron. Reliab. 53(9-11): 1306-1310 (2013)

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