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Jinbo Wan

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2010 – 2019

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2017
[c9]
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  - conf/vlsi/KerkhoffAWIP17
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Hans G. Kerkhoff, Ghazanfar Ali, Jinbo Wan, Ahmed Ibrahim, Jerrin Pathrose:
Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems. VLSI-SoC 2017: 1-6
2016
[c8]
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  - conf/fdl/AleksandrowiczA16
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Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao:
Designing reliable cyber-physical systems overview associated to the special session at FDL'16. FDL 2016: 1-8
2015
[c7]
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Jinbo Wan, Hans G. Kerkhoff:
New drain current model for nano-meter MOS transistors on-chip threshold voltage test. ETS 2015: 1-6
[c6]
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Jinbo Wan, Hans G. Kerkhoff:
Embedded instruments for enhancing dependability of analogue and mixed-signal IPs. NEWCAS 2015: 1-4
2014
[c5]
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Jinbo Wan, Hans G. Kerkhoff:
An embedded offset and gain instrument for OpAmp IPs. DATE 2014: 1-4
[c4]
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  - conf/dtis/KerkhoffWZ14
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Hans G. Kerkhoff, Jinbo Wan, Yong Zhao:
Linking aging measurements of health-monitors and specifications for multi-processor SoCs. DTIS 2014: 1-6
2013
[c3]
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Jinbo Wan, Hans G. Kerkhoff:
An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. ISQED 2013: 31-37
2012
[c2]
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Jinbo Wan, Hans G. Kerkhoff:
Monitoring active filters under automotive aging scenarios with embedded instrument. DATE 2012: 1096-1101
2011
[c1]
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  - conf/isocc/WanK11
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Jinbo Wan, Hans G. Kerkhoff:
Boosted gain programmable Opamp with embedded gain monitor for dependable SoCs. ISOCC 2011: 294-297

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