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ORCIDManuel Iván Rodríguez-Borbón
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2020 – today
- 2020
[j10]Marina De La Vega
, Yolanda A. Báez-López, Jorge Limon-Romero, Diego A. Tlapa, Dora-Luz Flores, Manuel Iván Rodríguez-Borbón, Aidé Aracely Maldonado-Macías:
Lean Manufacturing Critical Success Factors for the Transportation Equipment Manufacturing Industry in Mexico. IEEE Access 8: 168534-168545 (2020)
2010 – 2019
- 2019
- [j9]Luis Alberto Rodríguez-Picón, Luis Asunción Pérez Dominguez, José Mejía, Iván Jc Pérez-Olguín, Manuel Iván Rodríguez-Borbón:
A Deconvolution Approach for Degradation Modeling With Measurement Error. IEEE Access 7: 143899-143911 (2019) - 2018
- [j8]Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta:
Degradation modeling based on gamma process models with random effects. Commun. Stat. Simul. Comput. 47(6): 1796-1810 (2018) - 2017
- [j7]Manuel Iván Rodríguez-Borbón, Manuel Arnoldo Rodríguez-Medina, Luis Alberto Rodríguez-Picón, Alejandro Alvarado-Iniesta, Naijun Sha:
Reliability Estimation for Accelerated Life Tests Based on a Cox Proportional Hazard Model with Error Effect. Qual. Reliab. Eng. Int. 33(7): 1407-1416 (2017) - [j6]Jorge Limon-Romero, Yolanda A. Báez, Diego A. Tlapa, Mitzy Pory-Lugo, Manuel Iván Rodríguez-Borbón:
Optimization of Multiple Response Variables Using the Desirability Function and a Bayesian Predictive Distribution. Res. Comput. Sci. 132: 85-95 (2017) - 2016
- [j5]Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez:
Reliability Model for Electronic Devices under Time Varying Voltage. Qual. Reliab. Eng. Int. 32(4): 1295-1306 (2016) - [j4]Manuel R. Piña-Monarrez, Jesús F. Ortiz-Yañez, Manuel Iván Rodríguez-Borbón:
Non-normal Capability Indices for the Weibull and Lognormal Distributions. Qual. Reliab. Eng. Int. 32(4): 1321-1329 (2016) - [j3]Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle:
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution. Qual. Reliab. Eng. Int. 32(8): 2901-2908 (2016) - [j2]Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Manuel R. Piña-Monarrez, Roberto Ambrosio, Arturo Del Valle:
Reliability Analysis for Laptop Computer Under Electrical Harmonics. Qual. Reliab. Eng. Int. 32(8): 2945-2960 (2016) - 2013
- [j1]Alejandro Alvarado-Iniesta, Jorge Luis García-Alcaraz, Manuel Iván Rodríguez-Borbón, Aidé Maldonado:
Optimization of the material flow in a manufacturing plant by use of artificial bee colony algorithm. Expert Syst. Appl. 40(12): 4785-4790 (2013)
Coauthor Index
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