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2010 – 2019
- 2018
[j6]Petra R. Maier, Veit B. Kleeberger
, Daniel Mueller-Gritschneder, Ulf Schlichtmann:
Fault Injection for Test-Driven Development of Robust SoC Firmware. ACM Trans. Embed. Comput. Syst. 17(1): 19:1-19:26 (2018)- 2016
- [j5]Shushanik Karapetyan, Veit Kleeberger, Ulf Schlichtmann:
FinFET-based product performance: Modeling and evaluation of standard cells in FinFET technologies. Microelectron. Reliab. 61: 30-34 (2016) - [c9]Petra R. Maier, Veit B. Kleeberger:
Embedded software reliability testing by unit-level fault injection. ASP-DAC 2016: 410-416 - [c8]Petra R. Maier, Veit Kleeberger, Daniel Mueller-Gritschneder, Ulf Schlichtmann:
Fault injection at host-compiled level with static fault set reduction for SoC firmware robustness testing. CODES+ISSS 2016: 18:1-18:10 - 2015
- [j4]Michael Glaß, Hananeh Aliee, Liang Chen, Mojtaba Ebrahimi, Faramarz Khosravi, Veit B. Kleeberger, Alexandra Listl, Daniel Müller-Gritschneder, Fabian Oboril, Ulf Schlichtmann, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis:
Application-aware cross-layer reliability analysis and optimization. it Inf. Technol. 57(3): 159-169 (2015) - [c7]Veit B. Kleeberger, Stefan Rutkowski, Ruth Coppens:
Design & verification of automotive SoC firmware. DAC 2015: 117:1-117:6 - 2014
- [j3]Andreas Herkersdorf, Hananeh Aliee, Michael Engel, Michael Glaß, Christina Gimmler-Dumont, Jörg Henkel, Veit Kleeberger, Michael A. Kochte, Johannes Maximilian Kühn, Daniel Mueller-Gritschneder, Sani R. Nassif, Holm Rauchfuss, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Mehdi Baradaran Tahoori, Jürgen Teich, Norbert Wehn, Christian Weis, Hans-Joachim Wunderlich:
Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience. Microelectron. Reliab. 54(6-7): 1066-1074 (2014) - [j2]Veit B. Kleeberger, Martin Barke, Christoph Werner, Doris Schmitt-Landsiedel, Ulf Schlichtmann:
A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits. Microelectron. Reliab. 54(6-7): 1083-1089 (2014) - [c6]Veit Kleeberger, Petra R. Maier, Ulf Schlichtmann:
Workload- and Instruction-Aware Timing Analysis: The missing Link between Technology and System-level Resilience. DAC 2014: 49:1-49:6 - [c5]Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn:
Connecting different worlds - Technology abstraction for reliability-aware design and Test. DATE 2014: 1-8 - 2013
- [j1]Veit Kleeberger, Christina Gimmler-Dumont, Christian Weis, Andreas Herkersdorf, Daniel Mueller-Gritschneder, Sani R. Nassif, Ulf Schlichtmann, Norbert Wehn:
A Cross-Layer Technology-Based Study of How Memory Errors Impact System Resilience. IEEE Micro 33(4): 46-55 (2013) - [c4]Veit Kleeberger, Helmut E. Graeb, Ulf Schlichtmann:
Predicting future product performance: modeling and evaluation of standard cells in FinFET technologies. DAC 2013: 33:1-33:6 - [c3]Veit Kleeberger, Daniel Mueller-Gritschneder, Ulf Schlichtmann:
Technology-aware system failure analysis in the presence of soft errors by Mixture Importance Sampling. DFTS 2013: 118-124 - 2012
- [c2]Alejandro Masrur, Philipp H. Kindt, Martin Becker, Samarjit Chakraborty, Veit Kleeberger, Martin Barke, Ulf Schlichtmann:
Schedulability Analysis for Processors with Aging-Aware Autonomic Frequency Scaling. RTCSA 2012: 11-20
2000 – 2009
- 2009
- [c1]Christoph Knoth, Veit B. Kleeberger, Petra Nordholz, Ulf Schlichtmann:
Fast and waveform independent characterization of current source models. BMAS 2009: 90-95
Coauthor Index
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