default search action

combined dblp search
author search
venue search
publication search

ask others

Jerry J. Broz

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2000 – 2009

see FAQ

What is the meaning of the colors in the publication lists?

2004
[c3]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/MannTSB04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/MannTSB04
William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz:
The Leading Edge of Production Wafer Probe Test Technology. ITC 2004: 1168-1195
2000
[c2]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/BrozAR00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/BrozAR00
Jerry J. Broz, James C. Andersen, Reynaldo M. Rincon:
Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. ITC 2000: 477-484

1990 – 1999

see FAQ

What is the meaning of the colors in the publication lists?

1999
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/BrozR99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/BrozR99
Jerry J. Broz, Reynaldo M. Rincon:
Probe contact resistance variations during elevated temperature wafer test. ITC 1999: 396-405

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.