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Fernando J. Guarín

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Journal Articles

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2004
[j2]
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  - journals/mr/FreemanRYG04
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Greg G. Freeman, Jae-Sung Rieh, Zhijian Yang, Fernando J. Guarín:
Reliability and performance scaling of very high speed SiGe HBTs. Microelectron. Reliab. 44(3): 397-410 (2004)
2003
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  - journals/ibmrd/DunnACFFGGGHJLOORSVWZSHHM03
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James S. Dunn, David C. Ahlgren, Douglas D. Coolbaugh, Natalie B. Feilchenfeld, Greg G. Freeman, David R. Greenberg, Robert A. Groves, Fernando J. Guarín, Youssef Hammad, Alvin J. Joseph, Louis D. Lanzerotti, Stephen A. St. Onge, Bradley A. Orner, Jae-Sung Rieh, Kenneth J. Stein, Steven H. Voldman, Ping-Chuan Wang, Michael J. Zierak, Seshadri Subbanna, David L. Harame, Dean A. Herman Jr., Bernard S. Meyerson:
Foundation of rf CMOS and SiGe BiCMOS technologies. IBM J. Res. Dev. 47(2-3): 101-138 (2003)

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