BibTeX records: Chuanzhao Yu

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@inproceedings{DBLP:conf/isscc/OliaeiKNHXRRGYGS12,
  author    = {Omid Oliaei and
               Mark Kirschenmann and
               David Newman and
               Kurt Hausmann and
               Haolu Xie and
               Patrick Rakers and
               Mahib Rahman and
               Michael Gomez and
               Chuanzhao Yu and
               Benjamin Gilsdorf and
               Kurt Sakamoto},
  title     = {A multiband multimode transmitter without driver amplifier},
  booktitle = {2012 {IEEE} International Solid-State Circuits Conference, {ISSCC}
               2012, San Francisco, CA, USA, February 19-23, 2012},
  pages     = {164--166},
  publisher = {{IEEE}},
  year      = {2012},
  url       = {https://doi.org/10.1109/ISSCC.2012.6176960},
  doi       = {10.1109/ISSCC.2012.6176960},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/conf/isscc/OliaeiKNHXRRGYGS12.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuYX06,
  author    = {Chuanzhao Yu and
               J. S. Yuan and
               Enjun Xiao},
  title     = {Dynamic voltage stress effects on nMOS varactor},
  journal   = {Microelectron. Reliab.},
  volume    = {46},
  number    = {9-11},
  pages     = {1812--1816},
  year      = {2006},
  url       = {https://doi.org/10.1016/j.microrel.2006.07.075},
  doi       = {10.1016/j.microrel.2006.07.075},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/YuYX06.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuJY06,
  author    = {Chuanzhao Yu and
               L. Jiang and
               Jiann{-}Shiun Yuan},
  title     = {Study of performance degradations in {DC-DC} converter due to hot
               carrier stress by simulation},
  journal   = {Microelectron. Reliab.},
  volume    = {46},
  number    = {9-11},
  pages     = {1840--1843},
  year      = {2006},
  url       = {https://doi.org/10.1016/j.microrel.2006.07.079},
  doi       = {10.1016/j.microrel.2006.07.079},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/YuJY06.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceee/YuYXY05,
  author    = {Chuanzhao Yu and
               Hong Yang and
               Enjun Xiao and
               J. S. Yuan},
  title     = {Voltage stress-induced performance degradation in {NMOSFET} mixer},
  journal   = {{IEICE} Electron. Express},
  volume    = {2},
  number    = {5},
  pages     = {133--137},
  year      = {2005},
  url       = {https://doi.org/10.1587/elex.2.133},
  doi       = {10.1587/elex.2.133},
  timestamp = {Thu, 10 Sep 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/ieiceee/YuYXY05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiaoGYY05,
  author    = {Enjun Xiao and
               P. P. Ghosh and
               Chuanzhao Yu and
               J. S. Yuan},
  title     = {Hot carrier and soft breakdown effects on {LNA} performance for ultra
               wideband communications},
  journal   = {Microelectron. Reliab.},
  volume    = {45},
  number    = {9-11},
  pages     = {1382--1385},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.07.025},
  doi       = {10.1016/j.microrel.2005.07.025},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/XiaoGYY05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuXY05,
  author    = {Chuanzhao Yu and
               Enjun Xiao and
               J. S. Yuan},
  title     = {Voltage stress-induced hot carrier effects on SiGe {HBT} {VCO}},
  journal   = {Microelectron. Reliab.},
  volume    = {45},
  number    = {9-11},
  pages     = {1402--1405},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.07.026},
  doi       = {10.1016/j.microrel.2005.07.026},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/YuXY05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuYS05,
  author    = {Chuanzhao Yu and
               J. S. Yuan and
               Anwar Sadat},
  title     = {Dynamic stress-induced high-frequency noise degradations in nMOSFETs},
  journal   = {Microelectron. Reliab.},
  volume    = {45},
  number    = {9-11},
  pages     = {1794--1799},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.07.096},
  doi       = {10.1016/j.microrel.2005.07.096},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/YuYS05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/SadatQYYX05,
  author    = {Anwar Sadat and
               Hongwei Qu and
               Chuanzhao Yu and
               J. S. Yuan and
               Huikai Xie},
  title     = {Low-power {CMOS} wireless {MEMS} motion sensor for physiological activity
               monitoring},
  journal   = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
  volume    = {52-I},
  number    = {12},
  pages     = {2539--2551},
  year      = {2005},
  url       = {https://doi.org/10.1109/TCSI.2005.857772},
  doi       = {10.1109/TCSI.2005.857772},
  timestamp = {Fri, 22 May 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/tcas/SadatQYYX05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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