BibTeX records: Thierry Conard

• > Home > Thierry Conard

@article{DBLP:journals/mr/LiSPSCSAAEBDNLGM07,
  author    = {Z. Li and
               Tom Schram and
               Luigi Pantisano and
               A. Stesmans and
               Thierry Conard and
               S. Shamuilia and
               V. V. Afanasiev and
               A. Akheyar and
               Sven Van Elshocht and
               D. P. Brunco and
               W. Deweerd and
               Y. Naoki and
               P. Lehnen and
               Stefan De Gendt and
               Kristin De Meyer},
  title     = {Mechanism of O\({}_{\mbox{2}}\)-anneal induced V\({}_{\mbox{fb}}\)
               shifts of Ru gated stacks},
  journal   = {Microelectron. Reliab.},
  volume    = {47},
  number    = {4-5},
  pages     = {518--520},
  year      = {2007},
  url       = {https://doi.org/10.1016/j.microrel.2007.01.054},
  doi       = {10.1016/j.microrel.2007.01.054},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/LiSPSCSAAEBDNLGM07.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/RothschildMKSEDCRVVVLBDJNAB07,
  author    = {A. Rothschild and
               R. Mitsuhashi and
               C. Kerner and
               X. Shi and
               J. L. Everaert and
               L. Date and
               Thierry Conard and
               Olivier Richard and
               C. Vrancken and
               R. Verbeeck and
               Anabela Veloso and
               A. Lauwers and
               M. de Potter de ten Broeck and
               I. Debusschere and
               M. Jurczak and
               M. Niwa and
               Philippe Absil and
               S. Biesemans},
  title     = {Optimization of HfSiON using a design of experiment {(DOE)} approach
               on 0.45 {V} V\({}_{\mbox{t}}\) Ni-FUSI {CMOS} transistors},
  journal   = {Microelectron. Reliab.},
  volume    = {47},
  number    = {4-5},
  pages     = {521--524},
  year      = {2007},
  url       = {https://doi.org/10.1016/j.microrel.2007.01.042},
  doi       = {10.1016/j.microrel.2007.01.042},
  timestamp = {Tue, 07 Jul 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/mr/RothschildMKSEDCRVVVLBDJNAB07.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/KaushikCDERCRWCG05,
  author    = {Vidya Kaushik and
               Martine Claes and
               Annelies Delabie and
               Sven Van Elshocht and
               Olivier Richard and
               Thierry Conard and
               Erika Rohr and
               Thomas Witters and
               Matty Caymax and
               Stefan De Gendt},
  title     = {Observation and characterization of defects in HfO\({}_{\mbox{2}}\)
               high-K gate dielectric layers},
  journal   = {Microelectron. Reliab.},
  volume    = {45},
  number    = {5-6},
  pages     = {798--801},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2004.11.045},
  doi       = {10.1016/j.microrel.2004.11.045},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/KaushikCDERCRWCG05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}