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Yong Hee Lee
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2010 – 2019
- 2015
- [b1]Yong Hee Lee:
A comprehensive protection scheme for distribution systems. Georgia Institute of Technology, Atlanta, GA, USA, 2015 - [j3]Na-young Kim, Yong-Hyuk Kim, Yourim Yoon, Hyo-Hyuc Im, Reno K. Y. Choi, Yong Hee Lee:
Correcting Air-Pressure Data Collected by MEMS Sensors in Smartphones. J. Sensors 2015: 245498:1-245498:10 (2015) - [c5]Yuemin Ding, Seung Ho Hong, Renzhi Lu, Jong-Beom Kim, Yong Hee Lee, Aidong Xu, Xiaobing Liang:
Experimental investigation of the packet loss rate of wireless industrial networks in real industrial environments. ICIA 2015: 1048-1053 - 2011
- [j2]Yong Hee Lee, Seung Hwan Min, Seung Ho Hong:
Extension of prioritized data analysis in the Foundation Fieldbus to three classes. Int. J. Commun. Syst. 24(9): 1122-1135 (2011) - [c4]Yong Hee Lee:
A Scrutinized Analysis Method of the Human Error Potential due to the Introduction of New Digital Devices to Nuclear Power Plants. HCI (22) 2011: 308-311 - [c3]Yeon Ju Oh, Yong Hee Lee, Jong Hun Yun:
A Study on the Operator's Erroneous Responses to the New Human Interface of a Digital Device to be Introduced to Nuclear Power Plants. HCI (22) 2011: 337-341
2000 – 2009
- 2007
- [c2]Tong Il Jang, Yong Hee Lee, Hyeon Kyo Lim:
The development of a qualitative analysis method to supplement the analysis of operator's human errors in MCR of NPPS. IFAC HMS 2007: 496-501 - 2006
- [c1]Young Chan Kim, Yi Tae Kim, Sung Ho Choi, Hae Kyung Kong, Sung In Hwang, Juhyun Ko, Bumsuk Kim, Tetsuo Asaba, Su Hun Lim, June Soo Hahn, Joon Hyuk Im, Tae Seok Oh, Duk Min Yi, Jong Moon Lee, Woon Phil Yang, Jung Chak Ahn, Eun Seung Jung, Yong Hee Lee:
1/2-inch 7.2MPixel CMOS Image Sensor with 2.25µm Pixels Using 4-Shared Pixel Structure for Pixel-Level Summation. ISSCC 2006: 1994-2003 - 2004
- [j1]Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee:
Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements. Microelectron. Reliab. 44(1): 47-51 (2004)
Coauthor Index
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