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Taisuke Iwakiri

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2000 – 2009

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2002
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  - conf/delta/YotsuyanagiHIIT02
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  - https://dblp.org/rec/conf/delta/YotsuyanagiHIIT02
Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada:
Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. DELTA 2002: 387-391
2001
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Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada:
Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. DFT 2001: 287-

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