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Kankar S. Dasgupta

◀ ▶ joint publications with Nirnjan M. Devashrayee

> Home > Persons > Kankar S. Dasgupta

Publications

2011
[j5]
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Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee:
Weighted Transition Based Reordering, Columnwise Bit Filling, and Difference Vector: A Power-Aware Test Data Compression Method. VLSI Design 2011: 756561:1-756561:8 (2011)
[j4]
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Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee:
Suitability of Various Low-Power Testing Techniques for IP Core-Based SoC: A Survey. VLSI Design 2011: 948926:1-948926:7 (2011)
2010
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Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee:
Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead. J. Electron. Test. 26(6): 679-688 (2010)
[j2]
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Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee:
Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds? - A Survey. VLSI Design 2010: 670476:1-670476:9 (2010)
[c12]
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  - conf/apccas/MehtaDD10
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Usha Sandeep Mehta, Kankar S. Dasgupta, Niranjan M. Devashrayee:
Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead. APCCAS 2010: 40-43
[c10]
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  - conf/issoc/MehtaDD10
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Usha Sandeep Mehta, Niranjan M. Devashrayee, Kankar S. Dasgupta:
Hamming Distance Based 2-D Reordering with Power Efficient Don't Care Bit Filling: Optimizing the test data compression method. SoC 2010: 1-7
[c9]
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Usha Sandeep Mehta, Niranjan M. Devashrayee, Kankar S. Dasgupta:
Combining Unspecified Test Data Bit Filling Methods and Run Length Based Codes to Estimate Compression, Power and Area Overhead. ISVLSI 2010: 448-449
[c8]
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  - conf/vlsid/MehlaDD10
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Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee:
Hamming Distance Based Reordering and Columnwise Bit Stuffing with Difference Vector: A Better Scheme for Test Data Compression with Run Length Based Codes. VLSI Design 2010: 33-38
2009
[c5]
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Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee:
Survey of Test Data Compression Technique Emphasizing Code Based Schemes. DSD 2009: 617-620

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