Kouichi Itoh

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Kazuo Sakiyama

> Home > Persons > Kouichi Itoh

Publications

2015
[j10]
- view
  authority control:
- export record
  dblp key:
  - journals/jce/YamamotoSIOTIT15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jce/YamamotoSIOTIT15
Dai Yamamoto, Kazuo Sakiyama, Mitsugu Iwamoto, Kazuo Ohta, Masahiko Takenaka, Kouichi Itoh, Naoya Torii:
A new method for enhancing variety and maintaining reliability of PUF responses and its evaluation on ASICs. J. Cryptogr. Eng. 5(3): 187-199 (2015)
2013
[j9]
- view
  - electronic edition via DOI (open access)
  - references & citations
  authority control:
- export record
  dblp key:
  - journals/jce/YamamotoSIOTI13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jce/YamamotoSIOTI13
Dai Yamamoto, Kazuo Sakiyama, Mitsugu Iwamoto, Kazuo Ohta, Masahiko Takenaka, Kouichi Itoh:
Variety enhancement of PUF responses using the locations of random outputting RS latches. J. Cryptogr. Eng. 3(4): 197-211 (2013)
2011
[c15]
- view
  - electronic edition via DOI (open access)
  - references & citations
  authority control:
- export record
  dblp key:
  - conf/ches/YamamotoSIOOTI11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ches/YamamotoSIOOTI11
Dai Yamamoto, Kazuo Sakiyama, Mitsugu Iwamoto, Kazuo Ohta, Takao Ochiai, Masahiko Takenaka, Kouichi Itoh:
Uniqueness Enhancement of PUF Responses Based on the Locations of Random Outputting RS Latches. CHES 2011: 390-406

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.