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Li Chen 0001
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Publications
- 2021
- [j22]Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen:
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. J. Electron. Test. 37(2): 271-278 (2021) - 2018
- [j20]Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87: 24-32 (2018) - 2017
- [c11]Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS 2017: 28-32 - 2016
- [j16]Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen:
A Built-in Single Event Upsets Detector for Sequential Cells. J. Electron. Test. 32(1): 11-20 (2016) - [j14]Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen:
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets. J. Electron. Test. 32(2): 137-145 (2016) - [j13]Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li:
An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. J. Electron. Test. 32(3): 385-391 (2016) - [c9]Haibin Wang, Rui Liu, Xuantian Li, Li Chen, David M. Hiemstra, Valeri Kirischian:
Total ionizing dose test facilities for micro-electronic circuits. CCECE 2016: 1-4 - 2015
- [j10]Haibin Wang, Rui Liu, Li Chen, Jinshun Bi, Mulong Li, Yuanqing Li:
A Novel Built-in Current Sensor for N-WELL SET Detection. J. Electron. Test. 31(4): 395-401 (2015) - [j9]Lixiang Li, Yuanqing Li, Haibin Wang, Rui Liu, Qiong Wu, Michael Newton, Yuan Ma, Li Chen:
Simulation and Experimental Evaluation of a Soft Error Tolerant Layout for SRAM 6T Bitcell in 65nm Technology. J. Electron. Test. 31(5-6): 561-568 (2015) - [c7]Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung:
Analysis of advanced circuits for SET measurement. IRPS 2015: 7 - 2014
- [j6]Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi:
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30(6): 751-761 (2014) - [c6]Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong:
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS 2014: 62-68
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