Joan Figueras

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Álvaro Gómez-Pau

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Publications

2020
[j46]
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Álvaro Gómez-Pau, Emili Lupon, Luz Balado, Joan Figueras:
Indirect and adaptive test of analogue circuits based on preselected steady-state response measures. IET Circuits Devices Syst. 14(5): 611-618 (2020)
2017
[j44]
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Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing. J. Electron. Test. 33(3): 315-328 (2017)
2016
[j43]
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Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Indirect test of M-S circuits using multiple specification band guarding. Integr. 55: 415-424 (2016)
[j42]
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Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Efficient Production Binning Using Octree Tessellation in the Alternate Measurements Space. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(8): 1386-1395 (2016)
2015
[c82]
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  - conf/dtis/Gomez-PauBF15
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Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Analog circuits testing using digitally coded indirect measurements. DTIS 2015: 1-6
2014
[j38]
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  - journals/mj/VatajeluGRF14
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Elena I. Vatajelu, Álvaro Gómez-Pau, Michel Renovell, Joan Figueras:
Sram cell stability metric under transient voltage noise. Microelectron. J. 45(10): 1348-1353 (2014)
[c78]
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Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
M-S specification binning based on digitally coded indirect measurements. ETS 2014: 1-6
2013
[c74]
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  - conf/ets/Gomez-PauBF13
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Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
M-S test based on specification validation using octrees in the measure space. ETS 2013: 1-6
2011
[c72]
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  - conf/ats/VatajeluGRF11
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Elena I. Vatajelu, Álvaro Gómez-Pau, Michel Renovell, Joan Figueras:
Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric. Asian Test Symposium 2011: 413-418

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