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Bin Liang

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Yaqing Chi

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Publications

2021
[j36]
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  - journals/iet-cds/LiuLCCY021
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  - https://dblp.org/rec/journals/iet-cds/LiuLCCY021
Jingtian Liu, Bin Liang, Jianjun Chen, Yaqing Chi, Li Yan, Yang Guo:
Current mirror with charge dissipation transistor for analogue single-event transient mitigation in space application. IET Circuits Devices Syst. 15(2): 136-140 (2021)
2020
[j30]
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  - journals/ieiceee/SongSLCC20
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  - https://dblp.org/rec/journals/ieiceee/SongSLCC20
Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen:
MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology. IEICE Electron. Express 17(4): 20190708 (2020)
[j29]
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  - journals/ieiceee/ChenHMLLCL20
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  - https://dblp.org/rec/journals/ieiceee/ChenHMLLCL20
Qian Chen, Jianwei Han, Yingqi Ma, Sai Li, Jingtian Liu, Yaqing Chi, Bin Liang:
Research on the influences of well structure on dose rate effects in 65nm CMOS circuit. IEICE Electron. Express 17(14): 20200205 (2020)
[j27]
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  - journals/symmetry/WuLCW20
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Anquan Wu, Bin Liang, Yaqing Chi, Zhenyu Wu:
Investigation of Heavy-Ion Induced Single-Event Transient in 28 nm Bulk Inverter Chain. Symmetry 12(4): 624 (2020)
2019
[j23]
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  - journals/access/YuanGCCCL19
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  - https://dblp.org/rec/journals/access/YuanGCCCL19
Hengzhou Yuan, Yang Guo, Jianjun Chen, Yaqing Chi, Xi Chen, Bin Liang:
28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery. IEEE Access 7: 47955-47961 (2019)
[j20]
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  - journals/ieiceee/SongSLCC19
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Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen:
Characterization of P-hit and N-hit single-event transient using heavy ion microbeam. IEICE Electron. Express 16(8): 20190141 (2019)
[j19]
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  - journals/symmetry/XuGSLC19
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Jingyan Xu, Yang Guo, Ruiqiang Song, Bin Liang, Yaqing Chi:
Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs. Symmetry 11(6): 793 (2019)
[c35]
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  - conf/asicon/SongSLCC19
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Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen:
A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area. ASICON 2019: 1-4
2017
[j15]
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  - journals/chinaf/LiangSHCCHCMS17
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Bin Liang, Ruiqiang Song, Jianwei Han, Yaqing Chi, Rui Chen, Chunmei Hu, Jianjun Chen, Yingqi Ma, Shipeng Shangguan:
Comparison of single-event upset generated by heavy ion and pulsed laser. Sci. China Inf. Sci. 60(7): 072401:1-072401:9 (2017)
[j13]
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  - journals/chinaf/SongCLCC17
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Ruiqiang Song, Shuming Chen, Bin Liang, Yaqing Chi, Jianjun Chen:
Modeling the impact of process and operation variations on the soft error rate of digital circuits. Sci. China Inf. Sci. 60(12): 129402 (2017)
2013
[c10]
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  - conf/nccet/ChiHLH13
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Yaqing Chi, Yibai He, Bin Liang, Chunmei Hu:
A Scan Chain Based SEU Test Method for Microprocessors. NCCET 2013: 180-185

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