Petros Xanthopoulos

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Talayeh Razzaghi

> Home > Persons > Petros Xanthopoulos

Publications

2019
[j17]
- view
  authority control:
- export record
  dblp key:
  - journals/anor/PanagopoulosXRS19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/anor/PanagopoulosXRS19
Orestis P. Panagopoulos, Petros Xanthopoulos, Talayeh Razzaghi, Onur Seref:
Relaxed support vector regression. Ann. Oper. Res. 276(1-2): 191-210 (2019)
2017
[j12]
- view
  authority control:
- export record
  dblp key:
  - journals/anor/SerefRX17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/anor/SerefRX17
Onur Seref, Talayeh Razzaghi, Petros Xanthopoulos:
Weighted relaxed support vector machines. Ann. Oper. Res. 249(1-2): 235-271 (2017)
[j10]
- view
  authority control:
- export record
  dblp key:
  - journals/ol/RazzaghiXS17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ol/RazzaghiXS17
Talayeh Razzaghi, Petros Xanthopoulos, Onur Seref:
Constraint relaxation, cost-sensitive learning and bagging for imbalanced classification problems with outliers. Optim. Lett. 11(5): 915-928 (2017)
2014
[j5]
- view
  authority control:
- export record
  dblp key:
  - journals/candie/XanthopoulosR14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/candie/XanthopoulosR14
Petros Xanthopoulos, Talayeh Razzaghi:
A weighted support vector machine method for control chart pattern recognition. Comput. Ind. Eng. 70: 134-149 (2014)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.