Fuchen Mu

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Xiaorong Duan

> Home > Persons > Fuchen Mu

Publications

2002
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/MuXTD02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MuXTD02
Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan:
Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction. Microelectron. Reliab. 42(6): 985-989 (2002)
2001
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/MuXTD01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MuXTD01
Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan:
A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under V_g=V_d. Microelectron. Reliab. 41(11): 1909-1913 (2001)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.