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Alodeep Sanyal
- > Home > Persons > Alodeep Sanyal
Publications
- 2012
- [j6]Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu:
A Pattern Generation Technique for Maximizing Switching Supply Currents Considering Gate Delays. IEEE Trans. Computers 61(7): 986-998 (2012) - [j5]Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays. IEEE Trans. Very Large Scale Integr. Syst. 20(3): 424-436 (2012) - 2010
- [j4]Alodeep Sanyal, Syed M. Alam, Sandip Kundu:
BIST to Detect and Characterize Transient and Parametric Failures. IEEE Des. Test Comput. 27(5): 50-59 (2010) - [j3]Alodeep Sanyal, Ashesh Rastogi, Wei Chen, Sandip Kundu:
An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects. IEEE Trans. Computers 59(7): 922-932 (2010) - 2009
- [j2]Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
An Improved Soft-Error Rate Measurement Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(4): 596-600 (2009) - [c11]Alodeep Sanyal, Abhisek Pan, Sandip Kundu:
A study on impact of aggressor de-rating in the context of multiple crosstalk effects in circuits. ACM Great Lakes Symposium on VLSI 2009: 529-534 - [c10]Alodeep Sanyal, Abhisek Pan, Sandip Kundu:
A study on impact of loading effect on capacitive crosstalk noise. ISQED 2009: 696-701 - 2008
- [j1]Ashesh Rastogi, Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu:
On Composite Leakage Current Maximization. J. Electron. Test. 24(4): 405-420 (2008) - [c9]Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu:
On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits. DATE 2008: 616-621 - [c8]Alodeep Sanyal, Syed M. Alam, Sandip Kundu:
A Built-In Self-Test Scheme for Soft Error Rate Characterization. IOLTS 2008: 65-70 - [c7]Alodeep Sanyal, Sandip Kundu:
A Built-in Test and Characterization Method for Circuit Marginality Related Failures. ISQED 2008: 838-843 - 2007
- [c6]Alodeep Sanyal, Sandip Kundu:
On Derating Soft Error Probability Based on Strength Filtering. IOLTS 2007: 152-160 - [c5]Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
Accelerating Soft Error Rate Testing Through Pattern Selection. IOLTS 2007: 191-193 - [c4]Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
On Accelerating Soft-Error Detection by Targeted Pattern Generation. ISQED 2007: 723-728 - [c3]Ashesh Rastogi, Wei Chen, Alodeep Sanyal, Sandip Kundu:
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect. VLSI Design 2007: 583-588 - 2006
- [c2]Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu:
A Pattern Generation Technique for Maximizing Power Supply Currents. ICCD 2006: 338-343
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