André K. Nieuwland

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

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Publications

2008
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Daniele Rossi, André K. Nieuwland, Cecilia Metra:
Simultaneous Switching Noise: The Relation between Bus Layout and Coding. IEEE Des. Test Comput. 25(1): 76-86 (2008)
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Daniele Rossi, André K. Nieuwland, Steven V. E. S. van Dijk, Richard P. Kleihorst, Cecilia Metra:
Power Consumption of Fault Tolerant Busses. IEEE Trans. Very Large Scale Integr. Syst. 16(5): 542-553 (2008)
2005
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Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra:
Exploiting ECC Redundancy to Minimize Crosstalk Impact. IEEE Des. Test Comput. 22(1): 59-70 (2005)
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Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra:
New ECC for Crosstalk Impact Minimization. IEEE Des. Test Comput. 22(4): 340-348 (2005)
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André K. Nieuwland, Atul Katoch, Daniele Rossi, Cecilia Metra:
Coding Techniques for Low Switching Noise in Fault Tolerant Busses. IOLTS 2005: 183-189
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Régis Leveugle, Yervant Zorian, Luca Breveglieri, André K. Nieuwland, Klaus Rothbart, Jean-Pierre Seifert:
On-Line Testing for Secure Implementations: Design and Validation. IOLTS 2005: 211
2004
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André K. Nieuwland, Richard P. Kleihorst:
IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors. J. Electron. Test. 20(5): 533-542 (2004)
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Daniele Rossi, A. Muccio, André K. Nieuwland, Atul Katoch, Cecilia Metra:
Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems. IOLTS 2004: 135-140
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André K. Nieuwland, Atul Katoch, Maurice Meijer:
Reducing Cross-Talk Induced Power Consumption and Delay. PATMOS 2004: 179-188
2003
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Daniele Rossi, Steven V. E. S. van Dijk, Richard P. Kleihorst, André K. Nieuwland, Cecilia Metra:
Power Consumption of Fault Tolerant Codes: the Active Elements. IOLTS 2003: 61-67
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André K. Nieuwland, Richard P. Kleihorst:
The positive effect on IC yield of embedded Fault Tolerance for SEUs. IOLTS 2003: 75-

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