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Frans G. M. de Jong

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2000 – 2009

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2008
[c15]
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Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong:
Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. ETS 2008: 27-32
2007
[c14]
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Alex S. Biewenga, Frans G. M. de Jong:
SiP-test: Predicting delivery quality. ITC 2007: 1-10
2006
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Frans G. M. de Jong, Alex S. Biewenga:
SiP-TAP: JTAG for SiP. ITC 2006: 1-10
2003
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Wouter Rijckaert, Frans G. M. de Jong:
Board Test Coverage: The Value of Prediction and How to Compare Numbers. ITC 2003: 1277
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Frans G. M. de Jong, Leon van de Logt:
IEEE P1581: To Live or Let die? ITC 2003: 1278
2002
[c10]
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Rodger Schuttert, Frans G. M. de Jong, Ben Kup:
Improved Test Monitor Circuit in Power Pin DfT. VTS 2002: 345-350
2001
[c9]
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D. C. L. (Erik) van Geest, Frans G. M. de Jong:
System-level DFT for consumer products. ETW 2001: 19-24
[c8]
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Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers:
Testing and programming flash memories on assemblies during high volume production. ITC 2001: 470-479
2000
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Frans G. M. de Jong, Ben Kup, Rodger Schuttert:
Power pin testing: making the test coverage complete. ITC 2000: 575-584

1990 – 1999

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1999
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Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg:
Static component interconnect test technology (SCITT) a new technology for assembly testing. ITC 1999: 439-448
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Frans G. M. de Jong, Rob Raaijmakers:
Static component interconnection test technology in practice. ITC 1999: 556-565
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Frans G. M. de Jong:
SCITT: Back to Basics in Mass Production Testing. ITC 1999: 1138
1992
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Frans G. M. de Jong, Adriaan J. de Lind van Wijngaarden:
Memory Interconnection Test at Board Level. ITC 1992: 328-337
1991
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Frans G. M. de Jong, Frank van der Heyden:
Testing the Integrity of the Boundary Scan Test Infrastructure. ITC 1991: 106-112
1990
[c1]
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Frans G. M. de Jong:
Boundary scan test used at board level: moving towards reality. ITC 1990: 235-242

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