Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDAkhil Garg 0001
Person information
- affiliation: Cadence Design Systems, Noida, India
- affiliation (former): STMicroelectronics India, Greater Noida, India
Other persons with the same name
- Akhil Garg 0002
![[0000-0001-5731-4105]](https://dblp1.uni-trier.de/img/orcid-mark.12x12.png "0000-0001-5731-4105")
— Huazhong University of Science and Technology, State Key Laboratory of Digital Manufacturing Equipment and Technology, Wuhan, China (and 2 more) - Akhil Garg 0003 — Indian Institute of Technology Delhi, Centre for Automotive Research and Tribology, India
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2014
[c10]Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, Akhil Garg, Richard Schoonover, James Sage, Don Pearl, Thomas J. Snethen:
Efficient testing of hierarchical core-based SOCs. ITC 2014: 1-10- 2013
- [c9]Krishna Chakravadhanula, Vivek Chickermane, Don Pearl, Akhil Garg, R. Khurana, Subhasish Mukherjee, P. Nagaraj:
SmartScan - Hierarchical test compression for pin-limited low power designs. ITC 2013: 1-9 - 2011
- [c8]Swapnil Bahl, Roberto Mattiuzzo, Shray Khullar, Akhil Garg, S. Graniello, Khader S. Abdel-Hafez, Salvatore Talluto:
State of the art low capture power methodology. ITC 2011: 1-10 - 2010
- [j1]Prashant Dubey, Akhil Garg, Shashank Mahajan:
Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time. J. Electron. Test. 26(6): 659-666 (2010)
2000 – 2009
- 2008
- [c7]Akhil Garg, Prashant Dubey:
On Chip Jitter Measurement through a High Accuracy TDC. ISQED 2008: 844-847 - [c6]Swapnil Bahl, Rajiv Sarkar, Akhil Garg:
Low Power Test. ITC 2008: 1 - 2007
- [c5]Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani:
Built in Defect Prognosis for Embedded Memories. DDECS 2007: 167-172 - [c4]Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani:
GALS Based Shared Test Architecture for Embedded Memories. ISCAS 2007: 157-160 - [c3]Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani:
Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. ISVLSI 2007: 171-178 - 2006
- [c2]Akhil Garg, Prashant Dubey:
Fuse Area Reduction based on Quantitative Yield Analysis and Effective Chip Cost. DFT 2006: 166-174 - [c1]Akhil Garg, Prashant Dubey:
Fuse Area Reduction Based on Quantitative Yield Analysis and Effective Chip Cost. SoCC 2006: 235-238
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 01:30 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
