ask others

W. Robert Daasch

> Home > Persons

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

showing all ?? records

2010 – today

see FAQ

What is the meaning of the colors in the publication lists?

2016
[c30]
- view
  - electronic edition via DOI
- export record
  dblp key:
  - conf/itc/ButlerND16
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/ButlerND16
Kenneth M. Butler, Amit Nahar, W. Robert Daasch:
What we know after twelve years developing and deploying test data analytics solutions. ITC 2016: 1-8
[c29]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/vts/SiatkowskiSWSDC16
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/vts/SiatkowskiSWSDC16
Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawat, W. Robert Daasch, John M. Carulli:
Consistency in wafer based outlier screening. VTS 2016: 1-6
2015
[c28]
- view
  - electronic edition via DOI
- export record
  dblp key:
  - conf/itc/SiatkowskiCWSWD15
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/SiatkowskiCWSWD15
Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch:
Generalization of an outlier model into a "global" perspective. ITC 2015: 1-10
2014
[j9]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - journals/tc/ShirleyD14
- ask others
- share record
  short URL:
  - https://dblp.org/rec/journals/tc/ShirleyD14
C. Glenn Shirley, W. Robert Daasch:
Copula Models of Correlation: A DRAM Case Study. IEEE Trans. Computers 63(10): 2389-2401 (2014)
[c27]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/ShirleyDNC14
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/ShirleyDNC14
C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy:
Board manufacturing test correlation to IC manufacturing test. ITC 2014: 1-8
2011
[c26]
- view
  - electronic edition via DOI
- export record
  dblp key:
  - conf/itc/GotkhindikarDBCN11
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/GotkhindikarDBCN11
Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar:
Die-level adaptive test: Real-time test reordering and elimination. ITC 2011: 1-10

2000 – 2009

see FAQ

What is the meaning of the colors in the publication lists?

2009
[j8]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - journals/dt/DaaschSN09
- ask others
- share record
  short URL:
  - https://dblp.org/rec/journals/dt/DaaschSN09
W. Robert Daasch, C. Glenn Shirley, Amit Nahar:
Statistics in Semiconductor Test: Going beyond Yield. IEEE Design & Test of Computers 26(5): 64-73 (2009)
[j7]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - journals/dt/ButlerCSND09
- ask others
- share record
  short URL:
  - https://dblp.org/rec/journals/dt/ButlerCSND09
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch:
Multidimensional Test Escape Rate Modeling. IEEE Design & Test of Computers 26(5): 74-82 (2009)
[c25]
- view
  - electronic edition via DOI
- export record
  dblp key:
  - conf/itc/GudavalliDNH09
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/GudavalliDNH09
Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin:
Application of non-parametric statistics of the parametric response for defect diagnosis. ITC 2009: 1-10
2008
[c24]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/dft/JainDA08
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/dft/JainDA08
Saurabh Jain, W. Robert Daasch, David Armbrust:
Analyzing the Impact of Fault Tolerant BIST for VLSI Design. DFT 2008: 152-160
2007
[c23]
- view
  - electronic edition via DOI
- export record
  dblp key:
  - conf/itc/TurakhiaDWS07
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/TurakhiaDWS07
Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke:
Silicon evaluation of longest path avoidance testing for small delay defects. ITC 2007: 1-10
2006
[j6]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - journals/dt/TurakhiaDLB06
- ask others
- share record
  short URL:
  - https://dblp.org/rec/journals/dt/TurakhiaDLB06
Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Design & Test of Computers 23(2): 100-109 (2006)
2005
[c22]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/DaaschM05
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/DaaschM05
W. Robert Daasch, Robert Madge:
Variance reduction and outliers: statistical analysis of semiconductor test data. ITC 2005: 9
[c21]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/DaaschM05a
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/DaaschM05a
W. Robert Daasch, Robert Madge:
Data-driven models for statistical testing: measurements, estimates and residuals. ITC 2005: 10
[c20]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/MadgeBWD05
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/MadgeBWD05
Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch:
The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10
[c19]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/NaharDS05
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/NaharDS05
Amit Nahar, W. Robert Daasch, S. Subramaniam:
Burn-in reduction using principal component analysis. ITC 2005: 10
[c18]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/vts/TurakhiaBMSD05
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/vts/TurakhiaBMSD05
Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432
2004
[c17]
- no documents available
- export record
  dblp key:
  - conf/iscas/XiaoSDWP04
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/iscas/XiaoSDWP04
Haiqiao Xiao, Rolf Schaumann, W. Robert Daasch, Phillip K. Wong, Branimir Pejcinovic:
A radio-frequency CMOS active inductor and its application in designing high-Q filters. ISCAS (4) 2004: 197-200
[c16]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/MadgeBTDSR04
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/MadgeBTDSR04
Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212
[c15]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/SchuermyerRD04
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/SchuermyerRD04
Chris Schuermyer, Jens Ruffler, W. Robert Daasch:
Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308
[c14]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/DaaschR04
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/DaaschR04
W. Robert Daasch, Manu Rehani:
Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. ITC 2004: 1428
[c13]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/vts/LongDMB04
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/vts/LongDMB04
Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192
2003
[j5]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - journals/dt/MadgeBD03
- ask others
- share record
  short URL:
  - https://dblp.org/rec/journals/dt/MadgeBD03
Robert Madge, Brady Benware, W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Design & Test of Computers 20(5): 46-53 (2003)
[c12]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/SchuermyerBCMDN03
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/SchuermyerBCMDN03
Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573
[c11]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/vts/BenwareMLD03
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/vts/BenwareMLD03
Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46
2002
[j4]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - journals/dt/KeshavarziTNDDRSH02
- ask others
- share record
  short URL:
  - https://dblp.org/rec/journals/dt/KeshavarziTNDDRSH02
Ali Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins:
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Design & Test of Computers 19(5): 36-43 (2002)
[j3]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - journals/dt/DaaschMMC02
- ask others
- share record
  short URL:
  - https://dblp.org/rec/journals/dt/DaaschMMC02
W. Robert Daasch, James McNames, Robert Madge, Kevin Cota:
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Design & Test of Computers 19(5): 74-81 (2002)
[c10]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/isqed/LimDC02
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/isqed/LimDC02
Chee How Lim, W. Robert Daasch, George Cai:
A Thermal-Aware Superscalar Microprocessor (invited). ISQED 2002: 517-522
[c9]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/TurnerAMDM02
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/TurnerAMDM02
David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge:
Isolating and Removing Sources of Variation in Test Data. ITC 2002: 464-471
[c8]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/MadgeGRMDSTT02
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/MadgeGRMDSTT02
Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner:
Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682
[c7]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/DaaschCMM01a
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/DaaschCMM01a
W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. ITC 2002: 1240
[c6]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/vts/MadgeRCD02
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/vts/MadgeRCD02
Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch:
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74
2001
[c5]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/DaaschCMM01
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/DaaschCMM01
W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor selection for variance reduction in I_DDQ and other parametric data. ITC 2001: 92-100
2000
[c4]
- view
  - electronic edition via DOI
  - electronic edition @ ieeecomputersociety.org
- export record
  dblp key:
  - conf/itc/DaaschMBC00
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/itc/DaaschMBC00
W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota:
Variance reduction using wafer patterns in I_ddQ data. ITC 2000: 189-198
[c3]
- view
  - electronic edition via DOI
- export record
  dblp key:
  - conf/pacs/DhodapkarLCD00
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/pacs/DhodapkarLCD00
Ashutosh S. Dhodapkar, Chee How Lim, George Cai, W. Robert Daasch:
TEM²P²EST: A Thermal Enabled Multi-model Power/Performance ESTimator. PACS 2000: 112-125

1990 – 1999

see FAQ

What is the meaning of the colors in the publication lists?

1995
[j2]
- view
  - electronic edition via DOI
- export record
  dblp key:
  - journals/jpdc/DriscollD95
- ask others
- share record
  short URL:
  - https://dblp.org/rec/journals/jpdc/DriscollD95
Michael A. Driscoll, W. Robert Daasch:
Accurate Predictions of Parallel Program Execution Time. J. Parallel Distrib. Comput. 25(1): 16-30 (1995)
1993
[c2]
- no documents available
- export record
  dblp key:
  - conf/iscas/WuSD93
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/iscas/WuSD93
Pan Wu, Rolf Schaumann, W. Robert Daasch:
A 20 MHz Fully-balanced Transconductance-C Filter in 2 µm CMOS Technology. ISCAS 1993: 1188-1191
1992
[j1]
- view
  - electronic edition via DOI
- export record
  dblp key:
  - journals/ijcta/DaaschWSW92
- ask others
- share record
  short URL:
  - https://dblp.org/rec/journals/ijcta/DaaschWSW92
W. Robert Daasch, Martine Wedlake, Rolf Schaumann, Pan Wu:
Automation of the ic layout of continuous-time transconductance-capacitor filters. I. J. Circuit Theory and Applications 20(3): 267-282 (1992)

1980 – 1989

see FAQ

What is the meaning of the colors in the publication lists?

1987
[c1]
- view
  - electronic edition via DOI
- export record
  dblp key:
  - conf/ics/PayneMD87
- ask others
- share record
  short URL:
  - https://dblp.org/rec/conf/ics/PayneMD87
William A. Payne III, Fillia Makedon, W. Robert Daasch:
High Speed Interconnection Using the Clos Network. ICS 1987: 96-111

Coauthor Index

see FAQ

maintained by

at