Google
Google Scholar
MS Academic
CiteSeerX
CORE
Semantic ScholarW. Robert Daasch
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
showing all ?? records
2010 – today
- 2016
[c30]Kenneth M. Butler, Amit Nahar, W. Robert Daasch:
What we know after twelve years developing and deploying test data analytics solutions. ITC 2016: 1-8- [c29]Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawat, W. Robert Daasch, John M. Carulli:
Consistency in wafer based outlier screening. VTS 2016: 1-6 - 2015
- [c28]Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch:
Generalization of an outlier model into a "global" perspective. ITC 2015: 1-10 - 2014
- [j9]C. Glenn Shirley, W. Robert Daasch:
Copula Models of Correlation: A DRAM Case Study. IEEE Trans. Computers 63(10): 2389-2401 (2014) - [c27]C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy:
Board manufacturing test correlation to IC manufacturing test. ITC 2014: 1-8 - 2011
- [c26]Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar:
Die-level adaptive test: Real-time test reordering and elimination. ITC 2011: 1-10
2000 – 2009
- 2009
- [j8]W. Robert Daasch, C. Glenn Shirley, Amit Nahar:
Statistics in Semiconductor Test: Going beyond Yield. IEEE Design & Test of Computers 26(5): 64-73 (2009) - [j7]Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch:
Multidimensional Test Escape Rate Modeling. IEEE Design & Test of Computers 26(5): 74-82 (2009) - [c25]Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin:
Application of non-parametric statistics of the parametric response for defect diagnosis. ITC 2009: 1-10 - 2008
- [c24]Saurabh Jain, W. Robert Daasch, David Armbrust:
Analyzing the Impact of Fault Tolerant BIST for VLSI Design. DFT 2008: 152-160 - 2007
- [c23]Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke:
Silicon evaluation of longest path avoidance testing for small delay defects. ITC 2007: 1-10 - 2006
- [j6]Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Design & Test of Computers 23(2): 100-109 (2006) - 2005
- [c22]W. Robert Daasch, Robert Madge:
Variance reduction and outliers: statistical analysis of semiconductor test data. ITC 2005: 9 - [c21]W. Robert Daasch, Robert Madge:
Data-driven models for statistical testing: measurements, estimates and residuals. ITC 2005: 10 - [c20]Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch:
The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10 - [c19]Amit Nahar, W. Robert Daasch, S. Subramaniam:
Burn-in reduction using principal component analysis. ITC 2005: 10 - [c18]Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432 - 2004
- [c17]Haiqiao Xiao, Rolf Schaumann, W. Robert Daasch, Phillip K. Wong, Branimir Pejcinovic:
A radio-frequency CMOS active inductor and its application in designing high-Q filters. ISCAS (4) 2004: 197-200 - [c16]Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212 - [c15]Chris Schuermyer, Jens Ruffler, W. Robert Daasch:
Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308 - [c14]W. Robert Daasch, Manu Rehani:
Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. ITC 2004: 1428 - [c13]Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192 - 2003
- [j5]Robert Madge, Brady Benware, W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Design & Test of Computers 20(5): 46-53 (2003) - [c12]Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573 - [c11]Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46 - 2002
- [j4]Ali Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins:
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Design & Test of Computers 19(5): 36-43 (2002) - [j3]W. Robert Daasch, James McNames, Robert Madge, Kevin Cota:
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Design & Test of Computers 19(5): 74-81 (2002) - [c10]Chee How Lim, W. Robert Daasch, George Cai:
A Thermal-Aware Superscalar Microprocessor (invited). ISQED 2002: 517-522 - [c9]David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge:
Isolating and Removing Sources of Variation in Test Data. ITC 2002: 464-471 - [c8]Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner:
Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682 - [c7]W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. ITC 2002: 1240 - [c6]Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch:
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74 - 2001
- [c5]W. Robert Daasch, Kevin Cota, James McNames, Robert Madge:
Neighbor selection for variance reduction in I_DDQ and other parametric data. ITC 2001: 92-100 - 2000
- [c4]W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota:
Variance reduction using wafer patterns in I_ddQ data. ITC 2000: 189-198 - [c3]Ashutosh S. Dhodapkar, Chee How Lim, George Cai, W. Robert Daasch:
TEM2P2EST: A Thermal Enabled Multi-model Power/Performance ESTimator. PACS 2000: 112-125
1990 – 1999
- 1995
- [j2]Michael A. Driscoll, W. Robert Daasch:
Accurate Predictions of Parallel Program Execution Time. J. Parallel Distrib. Comput. 25(1): 16-30 (1995) - 1993
- [c2]Pan Wu, Rolf Schaumann, W. Robert Daasch:
A 20 MHz Fully-balanced Transconductance-C Filter in 2 µm CMOS Technology. ISCAS 1993: 1188-1191 - 1992
- [j1]W. Robert Daasch, Martine Wedlake, Rolf Schaumann, Pan Wu:
Automation of the ic layout of continuous-time transconductance-capacitor filters. I. J. Circuit Theory and Applications 20(3): 267-282 (1992)
1980 – 1989
- 1987
- [c1]William A. Payne III, Fillia Makedon, W. Robert Daasch:
High Speed Interconnection Using the Clos Network. ICS 1987: 96-111
Coauthor Index
maintained by 
at 
at 
last updated on 2018-06-28 14:20 CEST by the dblp team
data released under the ODC-BY 1.0 license
see also: Terms of Use | Privacy Policy | Imprint