BibTeX records: Congshu Zhou

download as .bib file

@inproceedings{DBLP:conf/cicc/TanZTLLZL13,
  author    = {Christine P. Tan and
               Congshu Zhou and
               Yi Tian and
               Chang Liu and
               Hein{-}Mun Lam and
               Jian Zhang and
               Mark Lu},
  title     = {Design for manufacturing layout analyses correlate layout to physico-chemical
               yield loss mechanisms},
  booktitle = {Proceedings of the {IEEE} 2013 Custom Integrated Circuits Conference,
               {CICC} 2013, San Jose, CA, USA, September 22-25, 2013},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2013},
  url       = {https://doi.org/10.1109/CICC.2013.6658535},
  doi       = {10.1109/CICC.2013.6658535},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/cicc/TanZTLLZL13.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of Schloss Dagstuhl - Leibniz Center for Informatics