BibTeX records: Wei Zhang 0032

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@article{DBLP:journals/tcas/0032CK13,
  author       = {Wei Zhang and
                  Ki Chul Chun and
                  Chris H. Kim},
  title        = {A Write-Back-Free 2T1D Embedded {DRAM} With Local Voltage Sensing
                  and a Dual-Row-Access Low Power Mode},
  journal      = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
  volume       = {60-I},
  number       = {8},
  pages        = {2030--2038},
  year         = {2013},
  url          = {https://doi.org/10.1109/TCSI.2013.2252652},
  doi          = {10.1109/TCSI.2013.2252652},
  timestamp    = {Fri, 22 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcas/0032CK13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jssc/Chun0JK12,
  author       = {Ki Chul Chun and
                  Wei Zhang and
                  Pulkit Jain and
                  Chris H. Kim},
  title        = {A 2T1C Embedded {DRAM} Macro With No Boosted Supplies Featuring a
                  7T {SRAM} Based Repair and a Cell Storage Monitor},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {47},
  number       = {10},
  pages        = {2517--2526},
  year         = {2012},
  url          = {https://doi.org/10.1109/JSSC.2012.2206685},
  doi          = {10.1109/JSSC.2012.2206685},
  timestamp    = {Sun, 30 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/Chun0JK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcas/Kim0K12,
  author       = {Tony Tae{-}Hyoung Kim and
                  Wei Zhang and
                  Chris H. Kim},
  title        = {An {SRAM} Reliability Test Macro for Fully Automated Statistical Measurements
                  of V\({}_{\mbox{MIN}}\) Degradation},
  journal      = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
  volume       = {59-I},
  number       = {3},
  pages        = {584--593},
  year         = {2012},
  url          = {https://doi.org/10.1109/TCSI.2011.2167264},
  doi          = {10.1109/TCSI.2011.2167264},
  timestamp    = {Fri, 22 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcas/Kim0K12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/cicc/0032CK12,
  author       = {Wei Zhang and
                  Ki Chul Chun and
                  Chris H. Kim},
  title        = {A write-back-free 2T1D embedded {DRAM} with local voltage sensing
                  and a dual-row-access low power mode},
  booktitle    = {Proceedings of the {IEEE} 2012 Custom Integrated Circuits Conference,
                  {CICC} 2012, San Jose, CA, USA, September 9-12, 2012},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/CICC.2012.6330623},
  doi          = {10.1109/CICC.2012.6330623},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/0032CK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jssc/KeaneZK11,
  author       = {John Keane and
                  Wei Zhang and
                  Chris H. Kim},
  title        = {An Array-Based Odometer System for Statistically Significant Circuit
                  Aging Characterization},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {46},
  number       = {10},
  pages        = {2374--2385},
  year         = {2011},
  url          = {https://doi.org/10.1109/JSSC.2011.2160813},
  doi          = {10.1109/JSSC.2011.2160813},
  timestamp    = {Sun, 30 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/KeaneZK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isscc/ZhangHBRFK11,
  author       = {Wei Zhang and
                  Mingjing Ha and
                  Daniele Braga and
                  Michael J. Renn and
                  C. Daniel Frisbie and
                  Chris H. Kim},
  title        = {A 1V printed organic {DRAM} cell based on ion-gel gated transistors
                  with a sub-10nW-per-cell Refresh Power},
  booktitle    = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2011,
                  Digest of Technical Papers, San Francisco, CA, USA, 20-24 February,
                  2011},
  pages        = {326--328},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ISSCC.2011.5746339},
  doi          = {10.1109/ISSCC.2011.5746339},
  timestamp    = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/ZhangHBRFK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isscc/ChunZJK11,
  author       = {Ki Chul Chun and
                  Wei Zhang and
                  Pulkit Jain and
                  Chris H. Kim},
  title        = {A 700MHz 2T1C embedded {DRAM} macro in a generic logic process with
                  no boosted supplies},
  booktitle    = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2011,
                  Digest of Technical Papers, San Francisco, CA, USA, 20-24 February,
                  2011},
  pages        = {506--507},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ISSCC.2011.5746418},
  doi          = {10.1109/ISSCC.2011.5746418},
  timestamp    = {Wed, 17 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/ChunZJK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/islped/ZhangCK10,
  author       = {Wei Zhang and
                  Ki Chul Chun and
                  Chris H. Kim},
  editor       = {Vojin G. Oklobdzija and
                  Barry Pangle and
                  Naehyuck Chang and
                  Naresh R. Shanbhag and
                  Chris H. Kim},
  title        = {Variation aware performance analysis of gain cell embedded DRAMs},
  booktitle    = {Proceedings of the 2010 International Symposium on Low Power Electronics
                  and Design, 2010, Austin, Texas, USA, August 18-20, 2010},
  pages        = {19--24},
  publisher    = {{ACM}},
  year         = {2010},
  url          = {https://doi.org/10.1145/1840845.1840850},
  doi          = {10.1145/1840845.1840850},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/islped/ZhangCK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/cicc/KimZK09,
  author       = {Tony Tae{-}Hyoung Kim and
                  Wei Zhang and
                  Chris H. Kim},
  title        = {An {SRAM} reliability test macro for fully-automated statistical measurements
                  of Vmin degradation},
  booktitle    = {{IEEE} Custom Integrated Circuits Conference, {CICC} 2009, San Jose,
                  California, USA, 13-16 September, 2009, Proceedings},
  pages        = {231--234},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://doi.org/10.1109/CICC.2009.5280846},
  doi          = {10.1109/CICC.2009.5280846},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/KimZK09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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