BibTeX records: Tze-Hsin Wu

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@inproceedings{DBLP:conf/itc/WuCLLWTLCPW12,
  author    = {Tze{-}Hsin Wu and
               Po{-}Yuan Chen and
               Mincent Lee and
               Bin{-}Yen Lin and
               Cheng{-}Wen Wu and
               Chen{-}Hung Tien and
               Hung{-}Chih Lin and
               Hao Chen and
               Ching{-}Nen Peng and
               Min{-}Jer Wang},
  title     = {A memory yield improvement scheme combining built-in self-repair and
               error correction codes},
  booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
               USA, November 5-8, 2012},
  pages     = {1--9},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://doi.org/10.1109/TEST.2012.6401576},
  doi       = {10.1109/TEST.2012.6401576},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/WuCLLWTLCPW12.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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