BibTeX records: Yannick Wimmer

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@article{DBLP:journals/mr/GosWERJSG18,
  author    = {Wolfgang G{\"{o}}s and
               Yannick Wimmer and
               A.{-}M. El{-}Sayed and
               Gerhard Rzepa and
               Markus Jech and
               Alexander L. Shluger and
               Tibor Grasser},
  title     = {Identification of oxide defects in semiconductor devices: {A} systematic
               approach linking {DFT} to rate equations and experimental evidence},
  journal   = {Microelectron. Reliab.},
  volume    = {87},
  pages     = {286--320},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.microrel.2017.12.021},
  doi       = {10.1016/j.microrel.2017.12.021},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/GosWERJSG18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SharmaTWRREPCG15,
  author    = {Prateek Sharma and
               Stanislav Tyaginov and
               Yannick Wimmer and
               Florian Rudolf and
               Karl Rupp and
               Hubert Enichlmair and
               J. H. Park and
               Hajdin Ceric and
               Tibor Grasser},
  title     = {Comparison of analytic distribution function models for hot-carrier
               degradation modeling in nLDMOSFETs},
  journal   = {Microelectron. Reliab.},
  volume    = {55},
  number    = {9-10},
  pages     = {1427--1432},
  year      = {2015},
  url       = {https://doi.org/10.1016/j.microrel.2015.06.021},
  doi       = {10.1016/j.microrel.2015.06.021},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/SharmaTWRREPCG15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KaczerFCGRTBWPT15,
  author    = {Ben Kaczer and
               Jacopo Franco and
               M. Cho and
               Tibor Grasser and
               Philippe J. Roussel and
               Stanislav Tyaginov and
               M. Bina and
               Yannick Wimmer and
               Luis{-}Miguel Procel and
               Lionel Trojman and
               Felice Crupi and
               G. Pitner and
               V. Putcha and
               Pieter Weckx and
               Erik Bury and
               Z. Ji and
               A. De Keersgieter and
               Thomas Chiarella and
               Naoto Horiguchi and
               Guido Groeseneken and
               Aaron Thean},
  title     = {Origins and implications of increased channel hot carrier variability
               in nFinFETs},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  pages     = {3},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/IRPS.2015.7112706},
  doi       = {10.1109/IRPS.2015.7112706},
  timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/KaczerFCGRTBWPT15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GrasserWGWESK15,
  author    = {Tibor Grasser and
               M. Wahl and
               Wolfgang G{\"{o}}s and
               Yannick Wimmer and
               A.{-}M. El{-}Sayed and
               Alexander L. Shluger and
               Ben Kaczer},
  title     = {On the volatility of oxide defects: Activation, deactivation, and
               transformation},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  pages     = {5},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/IRPS.2015.7112739},
  doi       = {10.1109/IRPS.2015.7112739},
  timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/GrasserWGWESK15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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