BibTeX records: Tom Waayers

download as .bib file

@inproceedings{DBLP:conf/dsd/KeimWMHK13,
  author    = {Martin Keim and
               Tom Waayers and
               Richard Morren and
               Friedrich Hapke and
               Rene Krenz{-}Baath},
  title     = {Industrial Application of {IEEE} {P1687} for an Automotive Product},
  booktitle = {2013 Euromicro Conference on Digital System Design, {DSD} 2013, Los
               Alamitos, CA, USA, September 4-6, 2013},
  pages     = {453--461},
  publisher = {{IEEE} Computer Society},
  year      = {2013},
  url       = {https://doi.org/10.1109/DSD.2013.57},
  doi       = {10.1109/DSD.2013.57},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/conf/dsd/KeimWMHK13.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WaayersMLK10,
  author    = {Tom Waayers and
               Richard Morren and
               Xijiang Lin and
               Mark Kassab},
  editor    = {Ron Press and
               Erik H. Volkerink},
  title     = {Clock control architecture and {ATPG} for reducing pattern count in
               SoC designs with multiple clock domains},
  booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
               USA, November 2-4, 2010},
  pages     = {114--123},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://doi.org/10.1109/TEST.2010.5699211},
  doi       = {10.1109/TEST.2010.5699211},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/WaayersMLK10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WaayersML05,
  author    = {Tom Waayers and
               Erik Jan Marinissen and
               Maurice Lousberg},
  title     = {{IEEE} Std 1500 Compliant Infrastructure forModular {SOC} Testing},
  booktitle = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
               India},
  pages     = {450},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://doi.org/10.1109/ATS.2005.67},
  doi       = {10.1109/ATS.2005.67},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/ats/WaayersML05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WaayersMG05,
  author    = {Tom Waayers and
               Richard Morren and
               Roberto Grandi},
  title     = {Definition of a robust modular {SOC} test architecture; resurrection
               of the single {TAM} daisy-chain},
  booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
               Austin, TX, USA, November 8-10, 2005},
  pages     = {10},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://doi.org/10.1109/TEST.2005.1584022},
  doi       = {10.1109/TEST.2005.1584022},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/WaayersMG05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/MarinissenW04,
  author    = {Erik Jan Marinissen and
               Tom Waayers},
  title     = {Infrastructure for modular {SOC} testing},
  booktitle = {Proceedings of the {IEEE} 2004 Custom Integrated Circuits Conference,
               {CICC} 2004, Orlando, FL, USA, October 2004},
  pages     = {671--678},
  publisher = {{IEEE}},
  year      = {2004},
  url       = {https://doi.org/10.1109/CICC.2004.1358916},
  doi       = {10.1109/CICC.2004.1358916},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/cicc/MarinissenW04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SeurenW04,
  author    = {Geert Seuren and
               Tom Waayers},
  title     = {Extending the Digital Core-based Test Methodology to Support Mixed-Signal},
  booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
               26-28, 2004, Charlotte, NC, {USA}},
  pages     = {281--289},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://doi.org/10.1109/TEST.2004.1386962},
  doi       = {10.1109/TEST.2004.1386962},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/SeurenW04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VermeulenWB03,
  author    = {Bart Vermeulen and
               Tom Waayers and
               Sjaak Bakker},
  title     = {Multi-TAP Controller Architecture for Digital System Chips},
  journal   = {J. Electronic Testing},
  volume    = {19},
  number    = {4},
  pages     = {417--424},
  year      = {2003},
  url       = {https://doi.org/10.1023/A:1024691909923},
  doi       = {10.1023/A:1024691909923},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/et/VermeulenWB03.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LogtHW03,
  author    = {Leon van de Logt and
               Frank van der Heyden and
               Tom Waayers},
  title     = {An extension to {JTAG} for at-speed debug on a system},
  booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
               Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
               NC, {USA}},
  pages     = {785--792},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://doi.org/10.1109/TEST.2003.1270910},
  doi       = {10.1109/TEST.2003.1270910},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/LogtHW03.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Waayers03,
  author    = {Tom Waayers},
  title     = {An improved Test Control Architecture and Test Control Expansion for
               Core-Based System Chips},
  booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
               Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
               NC, {USA}},
  pages     = {1145--1154},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://doi.org/10.1109/TEST.2003.1271103},
  doi       = {10.1109/TEST.2003.1271103},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/Waayers03.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VrankenWFL02,
  author    = {Harald P. E. Vranken and
               Tom Waayers and
               H{\'{e}}rv{\'{e}} Fleury and
               David Lelouvier},
  title     = {Enhanced Reduced Pin-Count Test for Full-Scan Design},
  journal   = {J. Electronic Testing},
  volume    = {18},
  number    = {2},
  pages     = {129--143},
  year      = {2002},
  url       = {https://doi.org/10.1023/A:1014989408897},
  doi       = {10.1023/A:1014989408897},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/et/VrankenWFL02.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VermeulenWB02,
  author    = {Bart Vermeulen and
               Tom Waayers and
               Sjaak Bakker},
  title     = {{EEE} 1149.1-Compliant Access Architecture for Multiple Core Debug
               on Digital System Chips},
  booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  pages     = {55--63},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://doi.org/10.1109/TEST.2002.1041745},
  doi       = {10.1109/TEST.2002.1041745},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/VermeulenWB02.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VermeulenWG02,
  author    = {Bart Vermeulen and
               Tom Waayers and
               Sandeep Kumar Goel},
  title     = {Core-Based Scan Architecture for Silicon Debug},
  booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  pages     = {638--647},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://doi.org/10.1109/TEST.2002.1041815},
  doi       = {10.1109/TEST.2002.1041815},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/VermeulenWG02.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VrankenWFL01,
  author    = {Harald P. E. Vranken and
               Tom Waayers and
               H{\'{e}}rv{\'{e}} Fleury and
               David Lelouvier},
  title     = {Enhanced reduced pin-count test for full-scan design},
  booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
               MD, USA, 30 October - 1 November 2001},
  pages     = {738--747},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://doi.org/10.1109/TEST.2001.966695},
  doi       = {10.1109/TEST.2001.966695},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/VrankenWFL01.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mtdt/KoranneWBWKV01,
  author    = {Sandeep Koranne and
               Tom Waayers and
               Robert Beurze and
               Clemens Wouters and
               Sunil Kumar and
               G. S. Visweswara},
  title     = {A {P1500} Compliant Programable BistShell for Embedded Memories},
  booktitle = {9th {IEEE} International Workshop on Memory Technology, Design, and
               Testing {(MTDT} 2001), 6-7 August 2001, San Jose, CA, {USA}},
  pages     = {21--28},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://doi.org/10.1109/MTDT.2001.945224},
  doi       = {10.1109/MTDT.2001.945224},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/mtdt/KoranneWBWKV01.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of Schloss Dagstuhl - Leibniz Center for Informatics