BibTeX records: Josep Rius Vázquez

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@article{DBLP:journals/tvlsi/Rius15,
  author    = {Josep Rius},
  title     = {Supply Noise and Impedance of On-Chip Power Distribution Networks
               in ICs With Nonuniform Power Consumption and Interblock Decoupling
               Capacitors},
  journal   = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume    = {23},
  number    = {6},
  pages     = {993--1004},
  year      = {2015},
  url       = {https://doi.org/10.1109/TVLSI.2014.2332189},
  doi       = {10.1109/TVLSI.2014.2332189},
  timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/tvlsi/Rius15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/Rius13,
  author    = {Josep Rius},
  title     = {IR-Drop in On-Chip Power Distribution Networks of ICs With Nonuniform
               Power Consumption},
  journal   = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume    = {21},
  number    = {3},
  pages     = {512--522},
  year      = {2013},
  url       = {https://doi.org/10.1109/TVLSI.2012.2188918},
  doi       = {10.1109/TVLSI.2012.2188918},
  timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/tvlsi/Rius13.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/bodynets/Rius10,
  author    = {Josep Rius},
  editor    = {Victor C. M. Leung and
               Athanasios V. Vasilakos and
               Thomas Falck and
               Karim Qayumi and
               Xinbing Wang},
  title     = {A single conductive surface as communication media for networked devices},
  booktitle = {5th International {ICST} Conference on Body Area Networks, {BODYNETS}
               2010, Corfu Island, Greece, September 10-12, 2010},
  pages     = {52--58},
  publisher = {{ACM} / {ICST}},
  year      = {2010},
  url       = {https://doi.org/10.1145/2221924.2221937},
  doi       = {10.1145/2221924.2221937},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/bodynets/Rius10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/inss/Rius10,
  author    = {Josep Rius},
  title     = {Two-dimensional communication of networked devices through a single
               conductive surface},
  booktitle = {Seventh International Conference on Networked Sensing Systems, {INSS}
               2010, Kassel, Germany, June 15-18, 2010},
  pages     = {115--122},
  publisher = {{IEEE}},
  year      = {2010},
  url       = {https://doi.org/10.1109/INSS.2010.5573945},
  doi       = {10.1109/INSS.2010.5573945},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/inss/Rius10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/Rius10,
  author    = {Josep Rius},
  title     = {A method for detecting resistive opens in buses},
  booktitle = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
               5-7 July, 2010, Corfu, Greece},
  pages     = {187--189},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://doi.org/10.1109/IOLTS.2010.5560210},
  doi       = {10.1109/IOLTS.2010.5560210},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/iolts/Rius10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/RiusM09,
  author    = {Josep Rius and
               Maurice Meijer},
  title     = {Analysis of the Influence of Substrate on the Performance of On-Chip
               {MOS} Decoupling Capacitors},
  journal   = {J. Solid-State Circuits},
  volume    = {44},
  number    = {2},
  pages     = {484--494},
  year      = {2009},
  url       = {https://doi.org/10.1109/JSSC.2008.2010806},
  doi       = {10.1109/JSSC.2008.2010806},
  timestamp = {Wed, 10 Jul 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/jssc/RiusM09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RiusVM09,
  author    = {Josep Rius and
               Luis Elvira Villagra and
               Maurice Meijer},
  title     = {A Voltage-Mode Testing Method to Detect {IDDQ} Defects in Digital
               Circuits},
  booktitle = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
               25-29, 2009},
  pages     = {135--140},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {https://doi.org/10.1109/ETS.2009.34},
  doi       = {10.1109/ETS.2009.34},
  timestamp = {Tue, 28 Apr 2020 11:43:42 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/RiusVM09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/MaquedaR09,
  author    = {Pablo Maqueda and
               Josep Rius},
  title     = {Analysis of the extra delay on interconnects caused by resistive opens
               and shorts},
  booktitle = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
               24-26 June 2009, Sesimbra-Lisbon, Portugal},
  pages     = {208--209},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {https://doi.org/10.1109/IOLTS.2009.5196016},
  doi       = {10.1109/IOLTS.2009.5196016},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/iolts/MaquedaR09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/RiusMP06,
  author    = {Josep Rius and
               Maurice Meijer and
               Jos{\'{e}} Pineda de Gyvez},
  title     = {An Activity Monitor for Power/Performance Tuning of {CMOS} Digital
               Circuits},
  journal   = {J. Low Power Electron.},
  volume    = {2},
  number    = {1},
  pages     = {80--86},
  year      = {2006},
  url       = {https://doi.org/10.1166/jolpe.2006.009},
  doi       = {10.1166/jolpe.2006.009},
  timestamp = {Fri, 22 May 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/jolpe/RiusMP06.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/patmos/RiusPM05,
  author    = {Josep Rius and
               Jos{\'{e}} Pineda de Gyvez and
               Maurice Meijer},
  editor    = {Vassilis Paliouras and
               Johan Vounckx and
               Diederik Verkest},
  title     = {An Activity Monitor for Power/Performance Tuning of {CMOS} Digital
               Circuits},
  booktitle = {Integrated Circuit and System Design, Power and Timing Modeling, Optimization
               and Simulation, 15th International Workshop, {PATMOS} 2005, Leuven,
               Belgium, September 21-23, 2005, Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {3728},
  pages     = {187--196},
  publisher = {Springer},
  year      = {2005},
  url       = {https://doi.org/10.1007/11556930\_20},
  doi       = {10.1007/11556930\_20},
  timestamp = {Tue, 14 May 2019 10:00:54 +0200},
  biburl    = {https://dblp.org/rec/conf/patmos/RiusPM05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/VazquezG04,
  author    = {Josep Rius V{\'{a}}zquez and
               Jos{\'{e}} Pineda de Gyvez},
  title     = {Power Supply Noise Monitor for Signal Integrity Faults},
  booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition
               {(DATE} 2004), 16-20 February 2004, Paris, France},
  pages     = {1406--1407},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://doi.org/10.1109/DATE.2004.1269109},
  doi       = {10.1109/DATE.2004.1269109},
  timestamp = {Tue, 23 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/date/VazquezG04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VazquezG04,
  author    = {Josep Rius V{\'{a}}zquez and
               Jos{\'{e}} Pineda de Gyvez},
  title     = {Built-in Current Sensor for ?I\{DDQ\} Testing of Deep Submicron Digital
               {CMOS} ICs},
  booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
               Napa Valley, CA, {USA}},
  pages     = {53--58},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://doi.org/10.1109/VTEST.2004.1299225},
  doi       = {10.1109/VTEST.2004.1299225},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/vts/VazquezG04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ManichGBLRRF04,
  author    = {Salvador Manich and
               L. Garc{\'{\i}}a and
               Luz Balado and
               Emili Lupon and
               Josep Rius and
               Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
               Joan Figueras},
  title     = {{BIST} Technique by Equally Spaced Test Vector Sequences},
  booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
               Napa Valley, CA, {USA}},
  pages     = {206--216},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://doi.org/10.1109/VTEST.2004.1299245},
  doi       = {10.1109/VTEST.2004.1299245},
  timestamp = {Mon, 27 Apr 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/vts/ManichGBLRRF04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ManichGBLRRF03,
  author    = {Salvador Manich and
               L. Garc{\'{\i}}a and
               Luz Balado and
               Emili Lupon and
               Josep Rius and
               R. Rodriguez and
               Joan Figueras},
  title     = {On the selection of efficient arithmetic additive test pattern generators
               [logic test]},
  booktitle = {8th European Test Workshop, {ETW} 2003, Maastricht, The Netherlands,
               May 25-28, 2003},
  pages     = {9--14},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://doi.org/10.1109/ETW.2003.1231662},
  doi       = {10.1109/ETW.2003.1231662},
  timestamp = {Tue, 28 Apr 2020 10:30:50 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/ManichGBLRRF03.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/patmos/RiusPMR03,
  author    = {Josep Rius and
               Alejandro Peidro and
               Salvador Manich and
               Rosa Rodriguez{-}S{\'{a}}nchez},
  editor    = {Jorge Juan{-}Chico and
               Enrico Macii},
  title     = {Power and Energy Consumption of {CMOS} Circuits: Measurement Methods
               and Experimental Results},
  booktitle = {Integrated Circuit and System Design, Power and Timing Modeling, Optimization
               and Simulation, 13th International Workshop, {PATMOS} 2003, Torino,
               Italy, September 10-12, 2003, Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {2799},
  pages     = {80--89},
  publisher = {Springer},
  year      = {2003},
  url       = {https://doi.org/10.1007/978-3-540-39762-5\_10},
  doi       = {10.1007/978-3-540-39762-5\_10},
  timestamp = {Tue, 14 May 2019 10:00:54 +0200},
  biburl    = {https://dblp.org/rec/conf/patmos/RiusPMR03.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrusemanOR02,
  author    = {Bram Kruseman and
               Stefan van den Oetelaar and
               Josep Rius},
  title     = {Comparison of {IDDQ} Testing and Very-Low Voltage Testing},
  booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  pages     = {964--973},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://doi.org/10.1109/TEST.2002.1041852},
  doi       = {10.1109/TEST.2002.1041852},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/KrusemanOR02.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RiusF99,
  author    = {Josep Rius and
               Joan Figueras},
  title     = {Exploring the Combination of {IDDQ} and iDDt Testing: Energy Testing},
  booktitle = {1999 Design, Automation and Test in Europe {(DATE} '99), 9-12 March
               1999, Munich, Germany},
  pages     = {543--548},
  publisher = {{IEEE} Computer Society / {ACM}},
  year      = {1999},
  url       = {https://doi.org/10.1109/DATE.1999.761180},
  doi       = {10.1109/DATE.1999.761180},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/date/RiusF99.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/integration/FerreIRRF98,
  author    = {Antoni Ferr{\'{e}} and
               Eugeni Isern and
               Josep Rius and
               Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
               Joan Figueras},
  title     = {{IDDQ} testing: state of the art and future trends},
  journal   = {Integr.},
  volume    = {26},
  number    = {1-2},
  pages     = {167--196},
  year      = {1998},
  url       = {https://doi.org/10.1016/S0167-9260(98)00027-3},
  doi       = {10.1016/S0167-9260(98)00027-3},
  timestamp = {Thu, 20 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/integration/FerreIRRF98.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RiusF96,
  author    = {Josep Rius and
               Joan Figueras},
  title     = {Dynamic characterization of Built-In Current Sensors based on {PN}
               junctions: Analysis and experiments},
  journal   = {J. Electronic Testing},
  volume    = {9},
  number    = {3},
  pages     = {295--310},
  year      = {1996},
  url       = {https://doi.org/10.1007/BF00134693},
  doi       = {10.1007/BF00134693},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/et/RiusF96.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RiusF95,
  author    = {Josep Rius and
               Joan Figueras},
  title     = {Detecting I/sub {DDQ/} defective {CMOS} circuits by depowering},
  booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
               Princeton, New Jersey, {USA}},
  pages     = {324--329},
  publisher = {{IEEE} Computer Society},
  year      = {1995},
  url       = {https://doi.org/10.1109/VTEST.1995.512656},
  doi       = {10.1109/VTEST.1995.512656},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/vts/RiusF95.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RiusF92,
  author    = {Josep Rius and
               Joan Figueras},
  title     = {Proportional {BIC} sensor for current testing},
  journal   = {J. Electronic Testing},
  volume    = {3},
  number    = {4},
  pages     = {387--396},
  year      = {1992},
  url       = {https://doi.org/10.1007/BF00135342},
  doi       = {10.1007/BF00135342},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/et/RiusF92.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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