BibTeX records: Shuting Shi

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@article{DBLP:journals/et/WangWTLSC21,
  author       = {JianAn Wang and
                  Xue Wu and
                  Haonan Tian and
                  Lixiang Li and
                  Shuting Shi and
                  Li Chen},
  title        = {Radiation Tolerant {SRAM} Cell Design in 65nm Technology},
  journal      = {J. Electron. Test.},
  volume       = {37},
  number       = {2},
  pages        = {255--262},
  year         = {2021},
  url          = {https://doi.org/10.1007/s10836-021-05941-5},
  doi          = {10.1007/S10836-021-05941-5},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/WangWTLSC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ShiCLCSLTC21,
  author       = {Shuting Shi and
                  Rui Chen and
                  Rui Liu and
                  Mo Chen and
                  Chen Shen and
                  Xuantian Li and
                  Haonan Tian and
                  Li Chen},
  title        = {Single Event Upset Evaluation for a 28-nm {FDSOI} {SRAM} Type Buffer
                  in an {ARM} Processor},
  journal      = {J. Electron. Test.},
  volume       = {37},
  number       = {2},
  pages        = {271--278},
  year         = {2021},
  url          = {https://doi.org/10.1007/s10836-021-05940-6},
  doi          = {10.1007/S10836-021-05940-6},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ShiCLCSLTC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiCNCWLCKSGBWW18,
  author       = {Yuanqing Li and
                  Li Chen and
                  Issam Nofal and
                  Mo Chen and
                  Haibin Wang and
                  Rui Liu and
                  Qingyu Chen and
                  Milos Krstic and
                  Shuting Shi and
                  Gang Guo and
                  Sang H. Baeg and
                  Shi{-}Jie Wen and
                  Richard Wong},
  title        = {Modeling and analysis of single-event transient sensitivity of a 65{\unicode{8239}}nm
                  clock tree},
  journal      = {Microelectron. Reliab.},
  volume       = {87},
  pages        = {24--32},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.016},
  doi          = {10.1016/J.MICROREL.2018.05.016},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiCNCWLCKSGBWW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/WangLDS0G16,
  author       = {Haibin Wang and
                  Mulong Li and
                  Xixi Dai and
                  Shuting Shi and
                  Li Chen and
                  Gang Guo},
  title        = {Layout-based Single Event Mitigation Techniques for Dynamic Logic
                  Circuits},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {1},
  pages        = {97--103},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-015-5559-8},
  doi          = {10.1007/S10836-015-5559-8},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/WangLDS0G16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/RenHSGCWWVB14,
  author       = {Yi Ren and
                  Anlin He and
                  Shuting Shi and
                  Gang Guo and
                  Li Chen and
                  Shi{-}Jie Wen and
                  Richard Wong and
                  N. W. van Vonno and
                  Bharat L. Bhuva},
  title        = {Single-Event Transient Measurements on a {DC/DC} Pulse Width Modulator
                  Using Heavy Ion, Proton, and Pulsed Laser},
  journal      = {J. Electron. Test.},
  volume       = {30},
  number       = {1},
  pages        = {149--154},
  year         = {2014},
  url          = {https://doi.org/10.1007/s10836-013-5431-7},
  doi          = {10.1007/S10836-013-5431-7},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/RenHSGCWWVB14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/RenSCWGGWWV13,
  author       = {Yi Ren and
                  Shuting Shi and
                  Li Chen and
                  Haibin Wang and
                  L.{-}J. Gao and
                  Gang Guo and
                  Shi{-}Jie Wen and
                  Richard Wong and
                  N. W. van Vonno},
  title        = {Correlation of Heavy-Ion and Laser Testing on a {DC/DC} {PWM} Controller},
  journal      = {J. Electron. Test.},
  volume       = {29},
  number       = {4},
  pages        = {609--616},
  year         = {2013},
  url          = {https://doi.org/10.1007/s10836-013-5379-7},
  doi          = {10.1007/S10836-013-5379-7},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/RenSCWGGWWV13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}