BibTeX records: M. Saliva

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@inproceedings{DBLP:conf/iolts/CachoNAFCS18,
  author       = {Florian Cacho and
                  D. Nouguier and
                  M. Arabi and
                  X. Federspiel and
                  Y. Carminati and
                  M. Saliva},
  editor       = {Dimitris Gizopoulos and
                  Dan Alexandrescu and
                  Mihalis Maniatakos and
                  Panagiota Papavramidou},
  title        = {Integrated Test Structures for Reliability Investigation under Dynamic
                  Stimuli},
  booktitle    = {24th {IEEE} International Symposium on On-Line Testing And Robust
                  System Design, {IOLTS} 2018, Platja D'Aro, Spain, July 2-4, 2018},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IOLTS.2018.8474074},
  doi          = {10.1109/IOLTS.2018.8474074},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/CachoNAFCS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/BravaixSCFNMKPH16,
  author       = {Alain Bravaix and
                  M. Saliva and
                  Florian Cacho and
                  X. Federspiel and
                  Cheikh Ndiaye and
                  Souhir Mhira and
                  Edith Kussener and
                  E. Pauly and
                  Vincent Huard},
  title        = {Hot-carrier and {BTI} damage distinction for high performance digital
                  application in 28nm {FDSOI} and 28nm {LP} {CMOS} nodes},
  booktitle    = {22nd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2016, Sant Feliu de Guixols, Spain, July 4-6,
                  2016},
  pages        = {43--46},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IOLTS.2016.7604669},
  doi          = {10.1109/IOLTS.2016.7604669},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/BravaixSCFNMKPH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/cicc/BenhassainCHSAP15,
  author       = {Ahmed Benhassain and
                  Florian Cacho and
                  Vincent Huard and
                  M. Saliva and
                  Lorena Anghel and
                  C. R. Parthasarathy and
                  Abhishek Jain and
                  Fabien Giner},
  title        = {Timing in-situ monitors: Implementation strategy and applications
                  results},
  booktitle    = {2015 {IEEE} Custom Integrated Circuits Conference, {CICC} 2015, San
                  Jose, CA, USA, September 28-30, 2015},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/CICC.2015.7338418},
  doi          = {10.1109/CICC.2015.7338418},
  timestamp    = {Fri, 06 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/BenhassainCHSAP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/SalivaCHFABBA15,
  author       = {M. Saliva and
                  Florian Cacho and
                  Vincent Huard and
                  X. Federspiel and
                  D. Angot and
                  Ahmed Benhassain and
                  Alain Bravaix and
                  Lorena Anghel},
  editor       = {Wolfgang Nebel and
                  David Atienza},
  title        = {Digital circuits reliability with in-situ monitors in 28nm fully depleted
                  {SOI}},
  booktitle    = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
                  Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
                  9-13, 2015},
  pages        = {441--446},
  publisher    = {{ACM}},
  year         = {2015},
  url          = {http://dl.acm.org/citation.cfm?id=2755854},
  timestamp    = {Mon, 09 Aug 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/date/SalivaCHFABBA15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/SalivaCNHABA15,
  author       = {M. Saliva and
                  Florian Cacho and
                  Cheikh Ndiaye and
                  Vincent Huard and
                  D. Angot and
                  Alain Bravaix and
                  Lorena Anghel},
  title        = {Impact of gate oxide breakdown in logic gates from 28nm {FDSOI} {CMOS}
                  technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112782},
  doi          = {10.1109/IRPS.2015.7112782},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SalivaCNHABA15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}