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ORCIDBibTeX records: Philippe Roussel
@inproceedings{DBLP:conf/irps/ViciDRFKW23,
author = {Andrea Vici and
Robin Degraeve and
Philippe J. Roussel and
Jacopo Franco and
Ben Kaczer and
Ingrid De Wolf},
title = {Analysis of {TDDB} lifetime projection in low thermal budget HfO2/SiO2
stacks for sequential 3D integrations},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--7},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117955},
doi = {10.1109/IRPS48203.2023.10117955},
timestamp = {Wed, 24 May 2023 09:43:44 +0200},
biburl = {https://dblp.org/rec/conf/irps/ViciDRFKW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZahedmaneshRCC23,
author = {Houman Zahedmanesh and
Philippe Roussel and
Ivan Ciofi and
Kristof Croes},
title = {A pragmatic network-aware paradigm for system-level electromigration
predictions at scale},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117698},
doi = {10.1109/IRPS48203.2023.10117698},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZahedmaneshRCC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PedreiraLZRVSCC22,
author = {O. Varela Pedreira and
Melina Lofrano and
Houman Zahedmanesh and
Philippe J. Roussel and
Marleen H. van der Veen and
Veerle Simons and
Emmanuel Chery and
Ivan Ciofi and
Kris Croes},
title = {Assessment of critical Co electromigration parameters},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {8},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764427},
doi = {10.1109/IRPS48227.2022.9764427},
timestamp = {Mon, 01 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PedreiraLZRVSCC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TsiaraLRSBSPCC22,
author = {Artemisia Tsiara and
Alicja Lesniewska and
Philippe Roussel and
Srinivasan Ashwyn Srinivasan and
Mathias Berciano and
Marko Simicic and
Marianna Pantouvaki and
Joris Van Campenhout and
Kristof Croes},
title = {Degradation mechanisms in Germanium Electro-Absorption Modulators},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {9},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764469},
doi = {10.1109/IRPS48227.2022.9764469},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TsiaraLRSBSPCC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TruijenOACTRCBK22,
author = {Brecht Truijen and
Barry J. O'Sullivan and
Md. Nurul Alam and
Dieter Claes and
M. Thesberg and
Philippe Roussel and
Adrian Vaisman Chasin and
Geert Van den Bosch and
Ben Kaczer and
Jan Van Houdt},
title = {Trap-polarization interaction during low-field trap characterization
on hafnia-based ferroelectric gatestacks},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {12--1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764603},
doi = {10.1109/IRPS48227.2022.9764603},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TruijenOACTRCBK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ViciDBRW22,
author = {Andrea Vici and
Robin Degraeve and
Jo{\~{a}}o Pedro Bastos and
Philippe Roussel and
Ingrid De Wolf},
title = {Combining {SILC} and {BD} statistics for low-voltage lifetime projection
in {HK/MG} stacks},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {27--1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764555},
doi = {10.1109/IRPS48227.2022.9764555},
timestamp = {Mon, 09 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ViciDBRW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ofc/CroesSTRSTFA22,
author = {Kristof Croes and
Veerle Simons and
Brecht Truijen and
Philippe Roussel and
Koen Van Sever and
Artemisia Tsiara and
Jacopo Franco and
Philippe Absil},
title = {Degradation mechanisms and lifetime assessment of Ge Vertical {PIN}
photodetectors},
booktitle = {Optical Fiber Communications Conference and Exhibition, {OFC} 2022,
San Diego, CA, USA, March 6-10, 2022},
pages = {1--3},
publisher = {{IEEE}},
year = {2022},
url = {https://ieeexplore.ieee.org/document/9748701},
timestamp = {Wed, 20 Apr 2022 08:53:41 +0200},
biburl = {https://dblp.org/rec/conf/ofc/CroesSTRSTFA22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsit/AlamHTKPORDHH22,
author = {Md Nur K. Alam and
Yusuke Higashi and
Brecht Truijen and
Ben Kaczer and
Mihaela Ioana Popovici and
Bj O'Sullivan and
Philippe Roussel and
Robin Degraeve and
Marc M. Heyns and
Jan Van Houdt},
title = {Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O2 pFET
and nFET from simultaneous {PV} and {IV} measurements},
booktitle = {{IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
pages = {340--342},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830476},
doi = {10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830476},
timestamp = {Thu, 04 Aug 2022 10:53:40 +0200},
biburl = {https://dblp.org/rec/conf/vlsit/AlamHTKPORDHH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuFTRTVBGLK21,
author = {Zhicheng Wu and
Jacopo Franco and
Brecht Truijen and
Philippe Roussel and
Stanislav Tyaginov and
Michiel Vandemaele and
Erik Bury and
Guido Groeseneken and
Dimitri Linten and
Ben Kaczer},
title = {Physics-based device aging modelling framework for accurate circuit
reliability assessment},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405106},
doi = {10.1109/IRPS46558.2021.9405106},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WuFTRTVBGLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LesniewskaRTVVV20,
author = {Alicja Lesniewska and
Philippe J. Roussel and
Davide Tierno and
Victor Vega{-}Gonzalez and
Marleen H. van der Veen and
Patrick Verdonck and
Nicolas Jourdan and
Christopher J. Wilson and
Zsolt T{\"{o}}kei and
Kris Croes},
title = {Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless
Ru Fill},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9129246},
doi = {10.1109/IRPS45951.2020.9129246},
timestamp = {Fri, 02 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LesniewskaRTVVV20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/SimicicWPRKG19,
author = {Marko Simicic and
Pieter Weckx and
Bertrand Parvais and
Philippe Roussel and
Ben Kaczer and
Georges G. E. Gielen},
title = {Understanding the Impact of Time-Dependent Random Variability on Analog
ICs: From Single Transistor Measurements to Circuit Simulations},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {27},
number = {3},
pages = {601--610},
year = {2019},
url = {https://doi.org/10.1109/TVLSI.2018.2878841},
doi = {10.1109/TVLSI.2018.2878841},
timestamp = {Sun, 19 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/SimicicWPRKG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/MakarovLTKRCVHE19,
author = {Alexander Makarov and
Dimitri Linten and
Stanislav Tyaginov and
Ben Kaczer and
Philippe Roussel and
Adrian Vaisman Chasin and
Michiel Vandemaele and
Geert Hellings and
Al{-}Moatasem El{-}Sayed and
Markus Jech and
Tibor Grasser},
title = {Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering
the Impact of Random Traps and Random Dopants},
booktitle = {49th European Solid-State Device Research Conference, {ESSDERC} 2019,
Cracow, Poland, September 23-26, 2019},
pages = {262--265},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ESSDERC.2019.8901721},
doi = {10.1109/ESSDERC.2019.8901721},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/MakarovLTKRCVHE19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HellingsRWBCSSS19,
author = {Geert Hellings and
Philippe Roussel and
Nian Wang and
Roman Boschke and
Shih{-}Hung Chen and
Marko Simicic and
Mirko Scholz and
Soeren Stoedel and
Kris Myny and
Dimitri Linten and
Paul Hellings and
Nowab Reza M. D. Ashif},
title = {Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and
Applications in {ESD} Using {TLP}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720517},
doi = {10.1109/IRPS.2019.8720517},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HellingsRWBCSSS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MakarovKRCGVHEG19,
author = {Alexander Makarov and
Ben Kaczer and
Philippe Roussel and
Adrian Vaisman Chasin and
Alexander Grill and
Michiel Vandemaele and
Geert Hellings and
Al{-}Moatasem El{-}Sayed and
Tibor Grasser and
Dimitri Linten and
Stanislav Tyaginov},
title = {Modeling the Effect of Random Dopants on Hot-Carrier Degradation in
FinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720584},
doi = {10.1109/IRPS.2019.8720584},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MakarovKRCGVHEG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuFCRRCGLGK19,
author = {Zhicheng Wu and
Jacopo Franco and
Dieter Claes and
Gerhard Rzepa and
Philippe J. Roussel and
Nadine Collaert and
Guido Groeseneken and
Dimitri Linten and
Tibor Grasser and
Ben Kaczer},
title = {Accelerated Capture and Emission {(ACE)} Measurement Pattern for Efficient
{BTI} Characterization and Modeling},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720541},
doi = {10.1109/IRPS.2019.8720541},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WuFCRRCGLGK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaczerFWRPBSCLP18,
author = {Ben Kaczer and
Jacopo Franco and
Pieter Weckx and
Philippe Roussel and
Vamsi Putcha and
Erik Bury and
Marko Simicic and
Adrian Vaisman Chasin and
Dimitri Linten and
Bertrand Parvais and
Francky Catthoor and
Gerhard Rzepa and
Michael Waltl and
Tibor Grasser},
title = {A brief overview of gate oxide defect properties and their relation
to {MOSFET} instabilities and device and circuit time-dependent variability},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {186--194},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.022},
doi = {10.1016/J.MICROREL.2017.11.022},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KaczerFWRPBSCLP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RzepaFOSSHWJKWR18,
author = {Gerhard Rzepa and
Jacopo Franco and
Barry J. O'Sullivan and
A. Subirats and
Marko Simicic and
Geert Hellings and
Pieter Weckx and
Markus Jech and
Theresia Knobloch and
Michael Waltl and
Philippe Roussel and
Dimitri Linten and
Ben Kaczer and
Tibor Grasser},
title = {Comphy - {A} compact-physics framework for unified modeling of {BTI}},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {49--65},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.002},
doi = {10.1016/J.MICROREL.2018.04.002},
timestamp = {Sun, 19 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RzepaFOSSHWJKWR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/DoevenspeckDCRV18,
author = {Jonas Doevenspeck and
Robin Degraeve and
Stefan Cosemans and
Philippe Roussel and
Bram{-}Ernst Verhoef and
Rudy Lauwereins and
Wim Dehaene},
title = {Analytic variability study of inference accuracy in {RRAM} arrays
with a binary tree winner-take-all circuit for neuromorphic applications},
booktitle = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
Dresden, Germany, September 3-6, 2018},
pages = {62--65},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ESSDERC.2018.8486860},
doi = {10.1109/ESSDERC.2018.8486860},
timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
biburl = {https://dblp.org/rec/conf/essderc/DoevenspeckDCRV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/BeekRODCLK18,
author = {Simon Van Beek and
Philippe Roussel and
Barry J. O'Sullivan and
Robin Degraeve and
Stefan Cosemans and
Dimitri Linten and
Gouri Sankar Kar},
title = {Study of breakdown in {STT-MRAM} using ramped voltage stress and all-in-one
maximum likelihood fit},
booktitle = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
Dresden, Germany, September 3-6, 2018},
pages = {146--149},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ESSDERC.2018.8486879},
doi = {10.1109/ESSDERC.2018.8486879},
timestamp = {Tue, 18 Dec 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/BeekRODCLK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RousselCDHLM18,
author = {Philippe J. Roussel and
Adrian Vaisman Chasin and
Steven Demuynck and
Naoto Horiguchi and
Dimitri Linten and
Anda Mocuta},
title = {New methodology for modelling {MOL} {TDDB} coping with variability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353555},
doi = {10.1109/IRPS.2018.8353555},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RousselCDHLM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/OSullivanBRRKCS18,
author = {Barry J. O'Sullivan and
Simon Van Beek and
Philippe J. Roussel and
Sidharth Rao and
Wonsub Kim and
S. Couet and
Johan Swerts and
Farrukh Yasin and
Dimitri Crotti and
Dimitri Linten and
Gouri Sankar Kar},
title = {Extended {RVS} characterisation of {STT-MRAM} devices: Enabling detection
of {AP/P} switching and breakdown},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353678},
doi = {10.1109/IRPS.2018.8353678},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/OSullivanBRRKCS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KocaayRCCLW18,
author = {Deniz Kocaay and
Philippe Roussel and
Kristof Croes and
Ivan Ciofi and
Alicja Lesniewska and
Ingrid De Wolf},
title = {Method to assess the impact of {LER} and spacing variation on {BEOL}
dielectric reliability using 2D-field simulations for {\textless}20nm
spacing},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {10--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353670},
doi = {10.1109/IRPS.2018.8353670},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KocaayRCCLW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KocaayRCCSW17,
author = {Deniz Kocaay and
Philippe Roussel and
Kris Croes and
Ivan Ciofi and
Y. Saad and
Ingrid De Wolf},
title = {{LER} and spacing variability on {BEOL} {TDDB} using E-field mapping:
Impact of field acceleration},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {131--135},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.053},
doi = {10.1016/J.MICROREL.2017.06.053},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KocaayRCCSW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RodopoulosRCSS16,
author = {Dimitrios Rodopoulos and
Philippe Roussel and
Francky Catthoor and
Yiannakis Sazeides and
Dimitrios Soudris},
editor = {Adrian Evans and
Stefano Di Carlo and
Praveen Raghavan and
Dimitris Gizopoulos},
title = {Approximating Standard Cell Delay Distributions by Reformulating the
Most Probable Failure Point},
booktitle = {Proceedings of the Workshop on Early Reliability Modeling for Aging
and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
{IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
2016), Dresden, Germany, March 18, 2016},
series = {{CEUR} Workshop Proceedings},
volume = {1566},
pages = {13--16},
publisher = {CEUR-WS.org},
year = {2016},
url = {https://ceur-ws.org/Vol-1566/Paper4.pdf},
timestamp = {Fri, 10 Mar 2023 16:22:47 +0100},
biburl = {https://dblp.org/rec/conf/date/RodopoulosRCSS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/WeckxKRFSRLTVCG15,
author = {Pieter Weckx and
Ben Kaczer and
Praveen Raghavan and
Jacopo Franco and
Marko Simicic and
Philippe J. Roussel and
Dimitri Linten and
Aaron Thean and
Diederik Verkest and
Francky Catthoor and
Guido Groeseneken},
title = {Characterization and simulation methodology for time-dependent variability
in advanced technologies},
booktitle = {2015 {IEEE} Custom Integrated Circuits Conference, {CICC} 2015, San
Jose, CA, USA, September 28-30, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/CICC.2015.7338379},
doi = {10.1109/CICC.2015.7338379},
timestamp = {Sun, 19 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/cicc/WeckxKRFSRLTVCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/KaczerFWRBCDLGK15,
author = {Ben Kaczer and
Jacopo Franco and
Pieter Weckx and
Philippe Roussel and
Erik Bury and
Moonju Cho and
Robin Degraeve and
Dimitri Linten and
Guido Groeseneken and
Halil Kukner and
Praveen Raghavan and
Francky Catthoor and
Gerhard Rzepa and
Wolfgang G{\"{o}}s and
Tibor Grasser},
title = {The defect-centric perspective of device and circuit reliability -
From individual defects to circuits},
booktitle = {45th European Solid State Device Research Conference, {ESSDERC} 2015,
Graz, Austria, September 14-18, 2015},
pages = {218--225},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ESSDERC.2015.7324754},
doi = {10.1109/ESSDERC.2015.7324754},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/KaczerFWRBCDLGK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icicdt/WeckxKRCG15,
author = {Pieter Weckx and
Ben Kaczer and
Philippe J. Roussel and
Francky Catthoor and
Guido Groeseneken},
title = {Impact of time-dependent variability on the yield and performance
of 6T {SRAM} cells in an advanced {HK/MG} technology},
booktitle = {2015 International Conference on {IC} Design {\&} Technology,
{ICICDT} 2015, Leuven, Belgium, June 1-3, 2015},
pages = {1--4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ICICDT.2015.7165896},
doi = {10.1109/ICICDT.2015.7165896},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icicdt/WeckxKRCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FrancoKRBMRGHTG15,
author = {Jacopo Franco and
Ben Kaczer and
Philippe J. Roussel and
Erik Bury and
Hans Mertens and
Romain Ritzenthaler and
Tibor Grasser and
Naoto Horiguchi and
Aaron Thean and
Guido Groeseneken},
title = {{NBTI} in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability
from planar to 3D architectures},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {2},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112694},
doi = {10.1109/IRPS.2015.7112694},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FrancoKRBMRGHTG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChaudharyKRCHM15,
author = {Ankush Chaudhary and
Ben Kaczer and
Philippe J. Roussel and
Thomas Chiarella and
Naoto Horiguchi and
Souvik Mahapatra},
title = {Time dependent variability in {RMG-HKMG} FinFETs: Impact of extraction
scheme on stochastic {NBTI}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112705},
doi = {10.1109/IRPS.2015.7112705},
timestamp = {Tue, 18 Dec 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ChaudharyKRCHM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KaczerFCGRTBWPT15,
author = {Ben Kaczer and
Jacopo Franco and
M. Cho and
Tibor Grasser and
Philippe J. Roussel and
Stanislav Tyaginov and
M. Bina and
Yannick Wimmer and
Luis{-}Miguel Procel and
Lionel Trojman and
Felice Crupi and
Gregory Pitner and
Vamsi Putcha and
Pieter Weckx and
Erik Bury and
Z. Ji and
An De Keersgieter and
Thomas Chiarella and
Naoto Horiguchi and
Guido Groeseneken and
Aaron Thean},
title = {Origins and implications of increased channel hot carrier variability
in nFinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112706},
doi = {10.1109/IRPS.2015.7112706},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KaczerFCGRTBWPT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WeckxKCFBCWRCG15,
author = {Pieter Weckx and
Ben Kaczer and
C. Chen and
Jacopo Franco and
Erik Bury and
K. Chanda and
J. Watt and
Philippe J. Roussel and
Francky Catthoor and
Guido Groeseneken},
title = {Characterization of time-dependent variability using 32k transistor
arrays in an advanced {HK/MG} technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112702},
doi = {10.1109/IRPS.2015.7112702},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WeckxKCFBCWRCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BeekMRDSMKMG15,
author = {Simon Van Beek and
Koen Martens and
Philippe Roussel and
Gabriele Luca Donadio and
Johan Swerts and
Sofie Mertens and
Gouri Sankar Kar and
Tai Min and
Guido Groeseneken},
title = {Four point probe ramped voltage stress as an efficient method to understand
breakdown of {STT-MRAM} MgO tunnel junctions},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112818},
doi = {10.1109/IRPS.2015.7112818},
timestamp = {Fri, 01 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BeekMRDSMKMG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VaisMFLARSCTHGD15,
author = {Abhitosh Vais and
Koen Martens and
Jacopo Franco and
Dennis Lin and
AliReza Alian and
Philippe Roussel and
S. Sioncke and
Nadine Collaert and
Aaron Thean and
Marc M. Heyns and
Guido Groeseneken and
Kristin De Meyer},
title = {The relationship between border traps characterized by {AC} admittance
and {BTI} in {III-V} {MOS} devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {5},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112742},
doi = {10.1109/IRPS.2015.7112742},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VaisMFLARSCTHGD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/BaoYRCBVBCRDRMTVTW14,
author = {Trong Huynh Bao and
Dmitry Yakimets and
Julien Ryckaert and
Ivan Ciofi and
Rogier Baert and
Anabela Veloso and
J{\"{u}}rgen B{\"{o}}mmels and
Nadine Collaert and
Philippe Roussel and
S. Demuynck and
Praveen Raghavan and
Abdelkarim Mercha and
Zsolt Tokei and
Diederik Verkest and
Aaron Thean and
Piet Wambacq},
title = {Circuit and process co-design with vertical gate-all-around nanowire
{FET} technology to extend {CMOS} scaling for 5nm and beyond technologies},
booktitle = {44th European Solid State Device Research Conference, {ESSDERC} 2014,
Venice Lido, Italy, September 22-26, 2014},
pages = {102--105},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ESSDERC.2014.6948768},
doi = {10.1109/ESSDERC.2014.6948768},
timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
biburl = {https://dblp.org/rec/conf/essderc/BaoYRCBVBCRDRMTVTW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Toledano-LuqueKFRGG12,
author = {Maria Toledano{-}Luque and
Ben Kaczer and
Jacopo Franco and
Philippe Roussel and
Tibor Grasser and
Guido Groeseneken},
title = {Defect-centric perspective of time-dependent {BTI} variability},
journal = {Microelectron. Reliab.},
volume = {52},
number = {9-10},
pages = {1883--1890},
year = {2012},
url = {https://doi.org/10.1016/j.microrel.2012.06.120},
doi = {10.1016/J.MICROREL.2012.06.120},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Toledano-LuqueKFRGG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrusamarelloWRM11,
author = {Lucas Brusamarello and
Gilson I. Wirth and
Philippe Roussel and
Miguel Miranda},
title = {Fast and accurate statistical characterization of standard cell libraries},
journal = {Microelectron. Reliab.},
volume = {51},
number = {12},
pages = {2341--2350},
year = {2011},
url = {https://doi.org/10.1016/j.microrel.2011.05.016},
doi = {10.1016/J.MICROREL.2011.05.016},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BrusamarelloWRM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/MirandaRBW11,
author = {Miguel Miranda and
Philippe Roussel and
Lucas Brusamarello and
Gilson I. Wirth},
editor = {Leon Stok and
Nikil D. Dutt and
Soha Hassoun},
title = {Statistical characterization of standard cells using design of experiments
with response surface modeling},
booktitle = {Proceedings of the 48th Design Automation Conference, {DAC} 2011,
San Diego, California, USA, June 5-10, 2011},
pages = {77--82},
publisher = {{ACM}},
year = {2011},
url = {https://doi.org/10.1145/2024724.2024742},
doi = {10.1145/2024724.2024742},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dac/MirandaRBW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MirandaZDR11,
author = {Miguel Miranda and
Paul Zuber and
Petr Dobrovoln{\'{y}} and
Philippe Roussel},
title = {Variability aware modeling for yield enhancement of {SRAM} and logic},
booktitle = {Design, Automation and Test in Europe, {DATE} 2011, Grenoble, France,
March 14-18, 2011},
pages = {1153--1158},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/DATE.2011.5763193},
doi = {10.1109/DATE.2011.5763193},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/MirandaZDR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/VerbreeMRV10,
author = {Jouke Verbree and
Erik Jan Marinissen and
Philippe Roussel and
Dimitrios Velenis},
title = {On the cost-effectiveness of matching repositories of pre-tested wafers
for wafer-to-wafer 3D chip stacking},
booktitle = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
May 24-28, 2010},
pages = {36--41},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ETSYM.2010.5512785},
doi = {10.1109/ETSYM.2010.5512785},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/VerbreeMRV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/eswa/NdiayeVR09,
author = {Amadou Ndiaye and
Guy Della Valle and
Philippe Roussel},
title = {Qualitative modelling of a multi-step process: The case of French
breadmaking},
journal = {Expert Syst. Appl.},
volume = {36},
number = {2},
pages = {1020--1038},
year = {2009},
url = {https://doi.org/10.1016/j.eswa.2007.11.006},
doi = {10.1016/J.ESWA.2007.11.006},
timestamp = {Wed, 14 Jun 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/eswa/NdiayeVR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/MirandaDZDKRP09,
author = {Miguel Miranda and
Bart Dierickx and
Paul Zuber and
Petr Dobrovoln{\'{y}} and
F. Kutscherauer and
Philippe Roussel and
Pavel Poliakov},
title = {Variability aware modeling of SoCs: From device variations to manufactured
system yield},
booktitle = {10th International Symposium on Quality of Electronic Design {(ISQED}
2009), 16-18 March 2009, San Jose, CA, {USA}},
pages = {547--553},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ISQED.2009.4810353},
doi = {10.1109/ISQED.2009.4810353},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/MirandaDZDKRP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/patmos/ZuberMRDM09,
author = {Paul Zuber and
Vladimir Matvejev and
Philippe Roussel and
Petr Dobrovoln{\'{y}} and
Miguel Miranda},
editor = {Jos{\'{e}} Monteiro and
Rene van Leuken},
title = {Exponent Monte Carlo for Quick Statistical Circuit Simulation},
booktitle = {Integrated Circuit and System Design. Power and Timing Modeling, Optimization
and Simulation, 19th International Workshop, {PATMOS} 2009, Delft,
The Netherlands, September 9-11, 2009, Revised Selected Papers},
series = {Lecture Notes in Computer Science},
volume = {5953},
pages = {36--45},
publisher = {Springer},
year = {2009},
url = {https://doi.org/10.1007/978-3-642-11802-9\_8},
doi = {10.1007/978-3-642-11802-9\_8},
timestamp = {Tue, 13 Sep 2022 21:45:42 +0200},
biburl = {https://dblp.org/rec/conf/patmos/ZuberMRDM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CrupiDGBRH07,
author = {Isodiana Crupi and
Robin Degraeve and
Bogdan Govoreanu and
David P. Brunco and
Philippe Roussel and
Jan Van Houdt},
title = {Distribution and generation of traps in SiO\({}_{\mbox{2}}\)/Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
gate stacks},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {525--527},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.013},
doi = {10.1016/J.MICROREL.2007.01.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CrupiDGBRH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaczerDRG07,
author = {Ben Kaczer and
Robin Degraeve and
Philippe Roussel and
Guido Groeseneken},
title = {Gate oxide breakdown in {FET} devices and circuits: From nanoscale
physics to system-level reliability},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {559--566},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.063},
doi = {10.1016/J.MICROREL.2007.01.063},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KaczerDRG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TremouillesTRNVG07,
author = {David Tr{\'{e}}mouilles and
Steven Thijs and
Philippe Roussel and
M. I. Natarajan and
Vesselin K. Vassilev and
Guido Groeseneken},
title = {Transient voltage overshoot in {TLP} testing - Real or artifact?},
journal = {Microelectron. Reliab.},
volume = {47},
number = {7},
pages = {1016--1024},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2006.11.004},
doi = {10.1016/J.MICROREL.2006.11.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TremouillesTRNVG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/modulad/VlietR06,
author = {Jocelyne Husson van Vliet and
Philippe Roussel},
title = {Estimation des titres viraux : une programmation pratique et fiable
sur calculatrice de poche, et accessible par l'Internet},
journal = {Monde des Util. Anal. Donn{\'{e}}es},
volume = {34},
pages = {55--73},
year = {2006},
url = {http://editions-rnti.fr/?inprocid=1001694},
timestamp = {Wed, 20 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/modulad/VlietR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/codes/PapanikolaouGMRC06,
author = {Antonis Papanikolaou and
T. Grabner and
Miguel Miranda and
Philippe Roussel and
Francky Catthoor},
editor = {Reinaldo A. Bergamaschi and
Kiyoung Choi},
title = {Yield prediction for architecture exploration in nanometer technology
nodes: : a model and case study for memory organizations},
booktitle = {Proceedings of the 4th International Conference on Hardware/Software
Codesign and System Synthesis, {CODES+ISSS} 2006, Seoul, Korea, October
22-25, 2006},
pages = {253--258},
publisher = {{ACM}},
year = {2006},
url = {https://doi.org/10.1145/1176254.1176315},
doi = {10.1145/1176254.1176315},
timestamp = {Mon, 26 Nov 2018 12:14:45 +0100},
biburl = {https://dblp.org/rec/conf/codes/PapanikolaouGMRC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiTRGM05,
author = {Yunlong Li and
Zsolt T{\"{o}}kei and
Philippe Roussel and
Guido Groeseneken and
Karen Maex},
title = {Layout dependency induced deviation from Poisson area scaling in {BEOL}
dielectric reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1299--1304},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.010},
doi = {10.1016/J.MICROREL.2005.07.010},
timestamp = {Fri, 02 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiTRGM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hopl/ColmerauerR93,
author = {Alain Colmerauer and
Philippe Roussel},
editor = {John A. N. Lee and
Jean E. Sammet},
title = {The Birth of Prolog},
booktitle = {History of Programming Languages Conference (HOPL-II), Preprints,
Cambridge, Massachusetts, USA, April 20-23, 1993},
pages = {37--52},
publisher = {{ACM}},
year = {1993},
url = {https://doi.org/10.1145/154766.155362},
doi = {10.1145/154766.155362},
timestamp = {Sat, 31 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/hopl/ColmerauerR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/slp/AponteFR84,
author = {Maria{-}Virginia Aponte and
Jos{\'{e}} Alberto Fern{\'{a}}ndez and
Philippe Roussel},
title = {Editing First-Order Proofs: Programmed Rules vs Derived Rules},
booktitle = {Proceedings of the 1984 International Symposium on Logic Programming,
Atlantic City, New Jersey, USA, February 6-9, 1984},
pages = {92--98},
publisher = {{IEEE-CS}},
year = {1984},
timestamp = {Wed, 04 Dec 2013 14:42:58 +0100},
biburl = {https://dblp.org/rec/conf/slp/AponteFR84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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