BibTeX records: André K. Nieuwland

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@article{DBLP:journals/dt/RossiNM08,
  author       = {Daniele Rossi and
                  Andr{\'{e}} K. Nieuwland and
                  Cecilia Metra},
  title        = {Simultaneous Switching Noise: The Relation between Bus Layout and
                  Coding},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {25},
  number       = {1},
  pages        = {76--86},
  year         = {2008},
  url          = {https://doi.org/10.1109/MDT.2008.25},
  doi          = {10.1109/MDT.2008.25},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/RossiNM08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tvlsi/RossiNDKM08,
  author       = {Daniele Rossi and
                  Andr{\'{e}} K. Nieuwland and
                  Steven V. E. S. van Dijk and
                  Richard P. Kleihorst and
                  Cecilia Metra},
  title        = {Power Consumption of Fault Tolerant Busses},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {16},
  number       = {5},
  pages        = {542--553},
  year         = {2008},
  url          = {https://doi.org/10.1109/TVLSI.2008.917535},
  doi          = {10.1109/TVLSI.2008.917535},
  timestamp    = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/RossiNDKM08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/NieuwlandJJ06,
  author       = {Andr{\'{e}} K. Nieuwland and
                  Samir Jasarevic and
                  Goran Jerin},
  title        = {Combinational Logic Soft Error Analysis and Protection},
  booktitle    = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006),
                  10-12 July 2006, Como, Italy},
  pages        = {99--104},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/IOLTS.2006.17},
  doi          = {10.1109/IOLTS.2006.17},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/NieuwlandJJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/dt/RossiNKM05,
  author       = {Daniele Rossi and
                  Andr{\'{e}} K. Nieuwland and
                  Atul Katoch and
                  Cecilia Metra},
  title        = {Exploiting {ECC} Redundancy to Minimize Crosstalk Impact},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {22},
  number       = {1},
  pages        = {59--70},
  year         = {2005},
  url          = {https://doi.org/10.1109/MDT.2005.10},
  doi          = {10.1109/MDT.2005.10},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/RossiNKM05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/dt/RossiNKM05a,
  author       = {Daniele Rossi and
                  Andr{\'{e}} K. Nieuwland and
                  Atul Katoch and
                  Cecilia Metra},
  title        = {New {ECC} for Crosstalk Impact Minimization},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {22},
  number       = {4},
  pages        = {340--348},
  year         = {2005},
  url          = {https://doi.org/10.1109/MDT.2005.91},
  doi          = {10.1109/MDT.2005.91},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/RossiNKM05a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/NieuwlandKRM05,
  author       = {Andr{\'{e}} K. Nieuwland and
                  Atul Katoch and
                  Daniele Rossi and
                  Cecilia Metra},
  title        = {Coding Techniques for Low Switching Noise in Fault Tolerant Busses},
  booktitle    = {11th {IEEE} International On-Line Testing Symposium {(IOLTS} 2005),
                  6-8 July 2005, Saint Raphael, France},
  pages        = {183--189},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/IOLTS.2005.19},
  doi          = {10.1109/IOLTS.2005.19},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/NieuwlandKRM05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/LeveugleZBNRS05,
  author       = {R{\'{e}}gis Leveugle and
                  Yervant Zorian and
                  Luca Breveglieri and
                  Andr{\'{e}} K. Nieuwland and
                  Klaus Rothbart and
                  Jean{-}Pierre Seifert},
  title        = {On-Line Testing for Secure Implementations: Design and Validation},
  booktitle    = {11th {IEEE} International On-Line Testing Symposium {(IOLTS} 2005),
                  6-8 July 2005, Saint Raphael, France},
  pages        = {211},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/IOLTS.2005.52},
  doi          = {10.1109/IOLTS.2005.52},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/LeveugleZBNRS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/NieuwlandK04,
  author       = {Andr{\'{e}} K. Nieuwland and
                  Richard P. Kleihorst},
  title        = {{IC} Cost Reduction by Applying Embedded Fault Tolerance for Soft
                  Errors},
  journal      = {J. Electron. Test.},
  volume       = {20},
  number       = {5},
  pages        = {533--542},
  year         = {2004},
  url          = {https://doi.org/10.1023/B:JETT.0000042517.30698.ad},
  doi          = {10.1023/B:JETT.0000042517.30698.AD},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/NieuwlandK04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/KretzschmarNM04,
  author       = {Claudia Kretzschmar and
                  Andr{\'{e}} K. Nieuwland and
                  Dietmar M{\"{u}}ller},
  title        = {Why Transition Coding for Power Minimization of On-Chip Buses Does
                  Not Work},
  booktitle    = {2004 Design, Automation and Test in Europe Conference and Exposition
                  {(DATE} 2004), 16-20 February 2004, Paris, France},
  pages        = {512--517},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/DATE.2004.1268897},
  doi          = {10.1109/DATE.2004.1268897},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/KretzschmarNM04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/RossiMNKM04,
  author       = {Daniele Rossi and
                  A. Muccio and
                  Andr{\'{e}} K. Nieuwland and
                  Atul Katoch and
                  Cecilia Metra},
  title        = {Impact of ECCs on Simultaneously Switching Output Noise for On-Chip
                  Busses of High Reliability Systems},
  booktitle    = {10th {IEEE} International On-Line Testing Symposium {(IOLTS} 2004),
                  12-14 July 2004, Funchal, Madeira Island, Portugal},
  pages        = {135--140},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.26},
  doi          = {10.1109/IOLTS.2004.26},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/RossiMNKM04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/NieuwlandG04,
  author       = {Andr{\'{e}} K. Nieuwland and
                  Patrick Gindner},
  title        = {Automated Logic {SER} Analysis and On-Line {SER} reduction},
  booktitle    = {10th {IEEE} International On-Line Testing Symposium {(IOLTS} 2004),
                  12-14 July 2004, Funchal, Madeira Island, Portugal},
  pages        = {177},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.16},
  doi          = {10.1109/IOLTS.2004.16},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/NieuwlandG04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/patmos/NieuwlandKM04,
  author       = {Andr{\'{e}} K. Nieuwland and
                  Atul Katoch and
                  Maurice Meijer},
  editor       = {Enrico Macii and
                  Odysseas G. Koufopavlou and
                  Vassilis Paliouras},
  title        = {Reducing Cross-Talk Induced Power Consumption and Delay},
  booktitle    = {Integrated Circuit and System Design, Power and Timing Modeling, Optimization
                  and Simulation; 14th International Workshop, {PATMOS} 2004, Santorini,
                  Greece, September 15-17, 2004, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {3254},
  pages        = {179--188},
  publisher    = {Springer},
  year         = {2004},
  url          = {https://doi.org/10.1007/978-3-540-30205-6\_20},
  doi          = {10.1007/978-3-540-30205-6\_20},
  timestamp    = {Tue, 14 May 2019 10:00:54 +0200},
  biburl       = {https://dblp.org/rec/conf/patmos/NieuwlandKM04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/RossiDKNM03,
  author       = {Daniele Rossi and
                  Steven V. E. S. van Dijk and
                  Richard P. Kleihorst and
                  Andr{\'{e}} K. Nieuwland and
                  Cecilia Metra},
  title        = {Power Consumption of Fault Tolerant Codes: the Active Elements},
  booktitle    = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
                  7-9 July 2003, Kos Island, Greece},
  pages        = {61--67},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/OLT.2003.1214368},
  doi          = {10.1109/OLT.2003.1214368},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/RossiDKNM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/NieuwlandK03,
  author       = {Andr{\'{e}} K. Nieuwland and
                  Richard P. Kleihorst},
  title        = {The positive effect on {IC} yield of embedded Fault Tolerance for
                  SEUs},
  booktitle    = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
                  7-9 July 2003, Kos Island, Greece},
  pages        = {75},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/OLT.2003.1214370},
  doi          = {10.1109/OLT.2003.1214370},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/NieuwlandK03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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