BibTeX records: Leon van de Logt

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@inproceedings{DBLP:conf/dft/PathroseLK19,
  author       = {Jerrin Pathrose and
                  Leon van de Logt and
                  Hans G. Kerkhoff},
  title        = {Analog Test Interface for {IEEE} 1687 Employing Split {SAR} Architecture
                  to Support Embedded Instrument Dependability Applications},
  booktitle    = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
                  October 2-4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/DFT.2019.8875372},
  doi          = {10.1109/DFT.2019.8875372},
  timestamp    = {Tue, 22 Oct 2019 15:42:19 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/PathroseLK19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/LogtZB19,
  author       = {Leon M. A. van de Logt and
                  Vladimir A. Zivkovic and
                  Ingrid H. A. van Baast},
  title        = {Model-driven {AMS} Test Setup Validation Tool prepared for {IEEE}
                  {P1687.2}},
  booktitle    = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
                  May 27-31, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ETS.2019.8791513},
  doi          = {10.1109/ETS.2019.8791513},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/LogtZB19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KrishnanJL07,
  author       = {Shaji Krishnan and
                  Rene Jonker and
                  Leon van de Logt},
  title        = {Variance Reduction for Supply Ramp Based Cheap {RF} Test Alternatives},
  booktitle    = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
                  2007},
  pages        = {55--62},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ETS.2007.44},
  doi          = {10.1109/ETS.2007.44},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/KrishnanJL07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LogtHW03,
  author       = {Leon van de Logt and
                  Frank van der Heyden and
                  Tom Waayers},
  title        = {An extension to {JTAG} for at-speed debug on a system},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {785--792},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270910},
  doi          = {10.1109/TEST.2003.1270910},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LogtHW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/JongL03,
  author       = {Frans G. M. de Jong and
                  Leon van de Logt},
  title        = {{IEEE} {P1581:} To Live or Let die?},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {1278},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1271118},
  doi          = {10.1109/TEST.2003.1271118},
  timestamp    = {Tue, 28 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/JongL03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}